Apex a22, showing a 1D cylinder composition profile
|Latest release:||alpha-41 / May 31, 2006|
|OS:||Mac OS X|
|Genre:||Atom-Probe Tomographic Analysis|
|License:||By arrangement with Olof Hellman|
Apex (Atom-probe experience) is a Macintosh OS X program developed by former Seidman-group member Olof Hellman under his company "Tomographic Softworks ." Apex runs on all of the NUCAPT macs and some of the personal machines of individuals in the Seidman group. Please contact Olof directly if you'd like to use Apex on your non-NU computer.
A mac with a G4 or G5 processor and OS X 10.3.9 or later is recommended. Apex can run on OS 10.3.8 and earlier versions of 10.3, but you will need to install libstdc++ version 6.0. However, the easiest way of doing this is to upgrade (for free) to version 10.3.9. The more memory the better, but at least 512 MB is recommended. In addition, one should have sufficient free disk space. As a rule of thumb, at least 100 bytes of free disk space per ion in a dataset you wish to work on – If you have a dataset of 2 million ions, try to have 200MB of free disk space. NUCAPT has a dual-2.7 GHz G5 with 8 GB of RAM and plenty of disk space to run Apex.
- Adjustable isoconcetration surfaces
- .ato (wide data / Rouen format)
- Manipulation via
- Hellman, Olof; Vandenbroucke, Justin; Blatz du Rivage, John; Seidman, David N. (2002). "Application software for data analysis for three-dimensional atom probe microscopy". Materials Science and Engineering A 327 (1): 29-33. doi:10.1016/S0921-5093(01)01887-1.
- Hellman, Olof C.; Blatz du Rivage, John; Seidman, David N. (2003). "Efficient sampling for three-dimensional atom probe microscopy data". Ultramicroscopy 95 (May-June): 199-205. doi:10.1016/S0304-3991(02)00317-0.
- Hellman, Olof C.; Vandenbroucke, Justin A.; Rusing, Jorg; Isheim, Dieter; Seidman, David N. (2000). "Analysis of Three-dimensional Atom-probe Data by the Proximity Histogram". Microscopy & Microanalysis 6 (5): 437-444. doi:10.1007/s100050010051.
- Hellman, Olof C.; Rusing, Jorg; Sebastian, Jason T.; Seidman, David N. (2001). "Atom-by-atom chemistry of internal interfaces: simulations and experiments". Materials Science and Engineering C 15 (1-2): 13-15. doi:10.1016/S0928-4931(01)00224-7.
The calculation of the Gibbsian interfacial excess is described in:
Hellman, Olof C.; Seidman, David N. (2002). "Measurement of the Gibbsian interfacial excess of solute at an interface of arbitrary geometry using three-dimensional atom probe microscopy". Materials Science and Engineering A 327 (1): 24-28. doi:10.1016/S0921-5093(01)01885-8.