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Ahmad, Zaki; Ul-Hamid, Anwar; B.J., Abdul-Aleem |
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The corrosion behavior of scandium alloyed Al 5052 in neutral sodium chloride solution |
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Journal Article |
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2001 |
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Abstract |
Corrosion Science |
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Corporate Author |
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43 |
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7 |
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Summary Language |
1227-1243 |
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Corrosion; Al–Mg–Sc; Age-hardening; Microstructure; Pitting potential; Polarization |
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Abbreviated Series Title |
Alloying with scandium has a strong influence on the strengthening and weight saving characteristics of Al–2.5Mg alloys. Scandium addition (0.1–0.3 wt.%) to Al–2.5Mg alloys does not introduce any appreciable loss in their resistance to corrosion in 3.5 wt.% NaCl. The corrosion behavior of these alloys is not significantly affected by age hardening. Because of a unique combination of outstanding mechanical properties and a good resistance to corrosion Al–Mg alloys containing scandium represent a major improvement over the more familiar Al–Mg alloys. |
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NU @ karnesky @ |
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435 |
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Ahn, I. S.; Kim, S. S.; Park, M. W.; Lee, K. M. |
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Phase Characteristics of Mechanically Alloyed Al-10wt.%Nb Alloy |
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Journal Article |
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2000 |
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Journal of Materials Science Letters |
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19 |
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22 |
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2015-2018 |
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refbase @ user |
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904 |
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Aleev, A.A.; Iskandarov, N.A.; Klimenkov, M.; Lindau, R.; Möslang, A.; Nikitin, A.A.; Rogozhkin, S.V.; Vladimirov, P.; Zaluzhnyi, A.G. |
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Investigation of oxide particles in unirradiated ODS Eurofer by tomographic atom probe |
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Journal Article |
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2011 |
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Journal of Nuclear Materials |
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409 |
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2 |
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65-71 |
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Ods; atom probe tomography; precipitation |
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Oxide dispersion strengthened steels possess better high-temperature creep and radiation resistance than conventionally produced ferritic/martensitic steels. This behavior is mainly caused by the presence of highly dispersed and extremely stable oxide particles with diameters of a few nanometers. In this work the nanostructure of ODS Eurofer steel was investigated by means of tomographic atom probe and correlations with recent TEM and SANS studies were derived. The present investigation revealed nanoscaled clusters of typically 2 nm diameter containing not only yttrium and oxygen but also vanadium and nitrogen. Moreover, concentration of vanadium in particles was found to be higher than that of yttrium, which indicates the importance of these elements in cluster formation. The estimated average cluster number density is about 2×1024 m-3. These enriched zones might be evidently attributed to precursors of the larger precipitates observed by TEM. This conclusion is also supported by the similarities of the chemical composition inside enriched zones seen in both atomic probe and TEM data. |
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0022-3115 |
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NU @ karnesky @ |
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10951 |
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Aleksankin, M. M.; Samchenko, I. P.; Fileleeva, L. I.; Nazarenko, V. A.; Pokrovskii, V. A.; Topchii, V. A. |
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Dissociation and rearrangements of molecular ions of sulfides, sulfoxides, and sulfones generated by a strong electric field |
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Journal Article |
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1987 |
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Teoreticheskaya I Eksperimentalnaya Khimiya |
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Teor. Eksp. Khim. |
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23 |
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3777 |
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Anderson, C. R.; Lee, R. N. |
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Accurate measurements of electron energies by field-emitter referencing |
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Journal Article |
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1984 |
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Journal of Electron Spectroscopy and Related Phenomena |
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J. Electron Spectrosc. Relat. Phenom. |
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34 |
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2 |
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173-198 |
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A new technique of electron Spectroscopy is described in which a standard electron spectrometer is used to compare the electron energy to be measured with the energies of electrons from a field-emitter reference source. Since the reference electrons are emitted at the Fermi level of the emitter tip, their total energy can be accurately measured with a high precision digital voltmeter. The measurements are automatically referenced to the absolute scale of energies and the need for calibration standards is eliminated. The application of the technique to X-ray photoelectron Spectroscopy (XPS) is described. Detailed analysis shows that the uncertainty in the field-emitter referenced XPS measurements is ± 0.06 electron volts. |
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8497 |
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Arbuzov, V. L.; Vykhodets, V. B.; Trakhtenberg, S., I; Davletshin, A. E.; Bakunin, O. M.; Plotnikov, S. A.; Lee, J. H.; Kim, S. J.; Chung, B. S. |
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The use of STM for investigation of surface relief in respect to tribologic properties of DLC coatings |
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Journal Article |
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1996 |
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Journal de Physique IV |
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J. de Phys. IV |
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6 |
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C5 |
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185-188 |
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Scanning Tunneling Microscopy |
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Miller, M. K.; Suvorov, A. L.; Bakhtizin, R. Z. |
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1155-4339 |
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2-86883-289-X |
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IFES |
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2114 |
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Bakhtizin, R. Z.; Valeev, V. G. |
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Field evaporation stimulated by a coherent electromagnetic wave |
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Journal Article |
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1990 |
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Surface Science |
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Surf. Sci. |
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231 |
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1-2 |
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135-138 |
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Field Ion Microscopy |
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Laser-stimulated processes of constant field evaporation of surface atoms are described. It is shown that under certain conditions the application of a weak alternating field may enhance ion tunneling and result in a significant increase in ion current. The paper offers a numerical estimation of the expected results of such an experiment. |
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4324 |
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Bakhtizin, R. Z.; Valeev, V. G. |
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Microroughness field emission electron energy distribution and electron-phonon interaction spectroscopy near the metal surface |
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Journal Article |
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1988 |
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Physica Status Solidi A |
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Phys. Stat. Sol. A |
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108 |
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1 |
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251-255 |
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Field Emission |
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Field electron emission is considered from microtips on the metal surface. The possibility is shown of field emission spectroscopy of electron-phonon interaction near the emitting surface and the influence is studied of an increase in the surface potential barrier transparency by application of a weak high-frequency field altering the character of the field electron energy distribution in such a system. |
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4012 |
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Bakhtizin, R. Z.; Valeev, V. G.; Kukharenko, Y. A. |
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Field emitted electron inelastic energy losses spectroscopy |
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Journal Article |
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1989 |
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Izv. Khim. |
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22 |
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Addendum to Atom Probe Field Ion Microscopy and Related Topics: A Bibliography for 1978-1987, 1988, and 1989 |
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4419 |
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Bakhtizin, R. Z.; Valeev, V. G.; Kukharenko, Y. A. |
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Inelastic energy losses at electron tunneling through potential barriers |
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Journal Article |
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1987 |
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Journal de Physique |
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J. de Phys. |
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48-C6 |
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no |
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3782 |
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