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Type Kim, I. – S.; Hunn, J. D.; Hashimoto, N.; Larson, D. J.; Maziasz, P. J.; Miyahara, K.; Lee, E. H.
  Publication Defect and void evolution in oxide dispersion strengthened ferritic steels under 3.2 MeV Fe+ ion irradiation with simultaneous helium injection Volume Journal Article
Pages 2000
  Abstract Journal of Nuclear Materials  
  Corporate Author J. Nucl. Mater.  
Publisher 280  
Editor
  Summary Language 264-274 Series Editor  
Abbreviated Series Title
  Series Issue ISSN  
Medium
  Expedition Notes  
Call Number  
Contribution Id  
Serial URL ISBN  
no 9024
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Kim, I. H.; Lee, H.; C. G., L; Kim, Y. H.; Park, B. G.; Lee, J. D. Fabrication of metal field emitter arrays on polycrystalline silicon Journal Article 1997 Journal of Vacuum Science & Technology A J. Vac. Sci. Technol. A B15 468-471 Field Emission no 2478
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Kim, I.; Lee, C. G.; Park, B. G.; Lee, J. D.; Won, J. H. Metal FEAs on double layer structure of polycrystalline silicon Journal Article 1996 Int. Vac. Microelectron. Conf., 9th (1996), 423-426 Publisher: Nevskii Kur'er, St. Petersburg, Russia. 423-426 Field Emission no 2009
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Kim, Jeong Kil; Kim, Yeong Ho; Lee, Bong Ho; Kim, Kyoo Young New findings on intergranular corrosion mechanism of stabilized stainless steels Journal Article 2011 Electrochimica Acta ADVANCES IN CORROSION SCIENCE FOR LIFETIME PREDICTION AND SUSTAINABILITYSelection of papers from the 56 4 1701-1710 Intergranular corrosion; Stainless steel; Stabilizer effect; Segregation; Chromium Number of different sets of stabilized both ferritic and austenitic stainless steels with various alloying elements were evaluated to verify new findings on the intergranular corrosion mechanism. The intergranular segregation and precipitation were analyzed by using a transmission electron microscopy with an energy dispersive X-ray spectroscopy and a laser assisted three-dimensional atom probe. On the basis of the current result, it is newly proposed that the intergranular corrosion occurring in the stabilized both ferritic and austenitic stainless steels is induced by Cr-depletion due to segregation of un-reacted Cr atoms around carbides of stabilizer elements (Ti or Nb) along the grain boundary, but not due to formation of Cr-carbide. A prevention method for this type of intergranular corrosion is also suggested after critical evaluation on the effect of Cr, C, and Ni. 0013-4686 no NU @ karnesky @ 11057
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Kim, S. - J.; Ju, B. K.; Lee, Y. H.; Park, B. S.; Baik, Y. - J.; Lim, S.; Oh, M. H. Emission characteristic of diamond-tip field emitter arrays fabricated by transfer mold technique Journal Article 1997 Journal of Vacuum Science & Technology A J. Vac. Sci. Technol. A B15 499-502 Field Emission no 2480
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Kim, S.-H.; Lee, J.Y.; Ahn, J.-P.; Choi, P.-P. Fabrication of Atom Probe Tomography Specimens from Nanoparticles Using a Fusible Bi-In-Sn Alloy as an Embedding Medium Journal Article 2019 Microscopy and Microanalysis 25 2 438-446 atom probe tomography; fusible alloy; nanoparticles We propose a new method for preparing atom probe tomography specimens from nanoparticles using a fusible bismuth-indium-tin alloy as an embedding medium. Iron nanoparticles synthesized by the sodium borohydride reduction method were chosen as a model system. The as-synthesized iron nanoparticles were embedded within the fusible alloy using focused ion beam milling and ion-milled to needle-shaped atom probe specimens under cryogenic conditions. An atom probe analysis revealed boron atoms in a detected iron nanoparticle, indicating that boron from the sodium borohydride reductant was incorporated into the nanoparticle during its synthesis. Cambridge University Press 2019/02/04 1431-9276 no NU @ karnesky @ 11534
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Kim, Y.-C.; Adusumilli, P.; Lauhon, L.J.; Seidman, D.N.; Jung, S.-Y.; Lee, H.-D.; Alvis, R.L.; Ulfig, R.M.; Olson, J.D. Three-dimensional atomic-scale mapping of Pd in Ni[sub:1 - x]Pd[sub:x]Si/Si(100) thin films Journal Article 2007 Applied Physics Letters Appl. Phys. Lett. 91 11 113106:1-3 annealing; interface roughness; nickel compounds; palladium compounds; rapid thermal processing; semiconductor-metal boundaries Atom-probe tomography was utilized to map the three-dimensional distribution of Pd atoms in nickel monosilicide thin films on Si(100). A solid-solution Ni0.95Pd0.05 film on a Si(100) substrate was subjected to rapid thermal processing plus steady-state annealing to simulate the thermal processing experienced by NiSi source and drain contacts in standard complementary metal-oxide-semiconductor processes. Pd is found to segregate at the (Ni0.95Pd0.05)Si/Si(100) heterophase interface, which may provide a previously unrecognized contribution to monosilicide stabilization. The silicide-Si heterophase interface was reconstructed in three dimensions on an atomic scale and its chemical roughness was evaluated. Aip no NU @ karnesky @ 9944
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Knipling, Keith E.; Karnesky, Richard A.; Lee, Constance P.; Dunand, David C.; Seidman, David N. Precipitation Evolution in Al-0.1Sc, Al-0.1Zr, and Al-0.1Sc-0.1Zr (at.%) Alloys during Isochronal Aging Journal Article 2010 Acta Materialia 58 15 5184-5195 Aluminum alloys, Precipitation, Scandium, Zirconium, Atom-probe tomography; Al-Sc-Zr Precipitation strengthening is investigated in binary Al-0.1Sc, Al-0.1Zr, and ternary Al-0.1Sc-0.1Zr (at.%) alloys aged isochronally between 200 and 600 °C. A pronounced synergistic effect is observed when both Sc and Zr are present. Above 325 °C, where peak microhardness (670 MPa) occurs in the binary Al-Sc alloy due to Al[sub:3]Sc (L1[sub:2]) nanometer-scale precipitates, Zr additions result in a secondary increase in strength due to additional precipitation of Zr-enriched outer shells onto these precipitates. The ternary alloy reaches a peak microhardness of 780 MPa at 400 °C, delaying overaging by >100 °C compared with the binary Al-Sc alloy and increasing strength compared with the binary Al-Zr alloy (peak microhardness of 420 MPa at 425450 °C). Compositions, radii, volume fractions, and number densities of the Al[sub:3](Sc[sub:1-x]Zr[sub:x]) precipitates are measured directly using atom-probe tomography. This information is used to quantify the observed strengthening increments, attributed to dislocation shearing of the Al[sub:3](Sc[sub:1-x]Zr[sub:x]) precipitates. no NU @ karnesky @ 10705
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Ko, C. G.; Ju, B. K.; Lee, Y. H.; Park, J. H.; Oh, M. H. Fabrication and characterization of diamond-like carbon coated knife edge field emitter array Journal Article 1996 Japanese Journal of Applied Physics Jpn. J. Appl. Phys. 35 L1305-L1307 Field Emission no 2232
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Koops, P., H W; Kretz, J.; Rudolph, M.; Weber, M.; Dahm, G.; Lee, K. L. Characterization and application of materials grown by electron-beam-induced deposition Journal Article 1994 Japanese Journal of Applied Physics Jpn. J. Appl. Phys. 33 7099-7107 Scanning Tunnelling Microscopy no 3083
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