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Kim, I. – S.; Hunn, J. D.; Hashimoto, N.; Larson, D. J.; Maziasz, P. J.; Miyahara, K.; Lee, E. H. |
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Defect and void evolution in oxide dispersion strengthened ferritic steels under 3.2 MeV Fe+ ion irradiation with simultaneous helium injection |
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2000 |
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Journal of Nuclear Materials |
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J. Nucl. Mater. |
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280 |
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264-274 |
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9024 |
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Kim, I. H.; Lee, H.; C. G., L; Kim, Y. H.; Park, B. G.; Lee, J. D. |
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Fabrication of metal field emitter arrays on polycrystalline silicon |
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Journal Article |
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1997 |
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Journal of Vacuum Science & Technology A |
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J. Vac. Sci. Technol. A |
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B15 |
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468-471 |
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Field Emission |
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2478 |
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Kim, I.; Lee, C. G.; Park, B. G.; Lee, J. D.; Won, J. H. |
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Metal FEAs on double layer structure of polycrystalline silicon |
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Journal Article |
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1996 |
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Int. Vac. Microelectron. Conf., 9th (1996), 423-426 Publisher: Nevskii Kur'er, St. Petersburg, Russia. |
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423-426 |
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Field Emission |
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2009 |
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Kim, Jeong Kil; Kim, Yeong Ho; Lee, Bong Ho; Kim, Kyoo Young |
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New findings on intergranular corrosion mechanism of stabilized stainless steels |
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Journal Article |
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2011 |
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Electrochimica Acta |
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ADVANCES IN CORROSION SCIENCE FOR LIFETIME PREDICTION AND SUSTAINABILITYSelection of papers from the |
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56 |
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4 |
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1701-1710 |
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Intergranular corrosion; Stainless steel; Stabilizer effect; Segregation; Chromium |
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Number of different sets of stabilized both ferritic and austenitic stainless steels with various alloying elements were evaluated to verify new findings on the intergranular corrosion mechanism. The intergranular segregation and precipitation were analyzed by using a transmission electron microscopy with an energy dispersive X-ray spectroscopy and a laser assisted three-dimensional atom probe. On the basis of the current result, it is newly proposed that the intergranular corrosion occurring in the stabilized both ferritic and austenitic stainless steels is induced by Cr-depletion due to segregation of un-reacted Cr atoms around carbides of stabilizer elements (Ti or Nb) along the grain boundary, but not due to formation of Cr-carbide. A prevention method for this type of intergranular corrosion is also suggested after critical evaluation on the effect of Cr, C, and Ni. |
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0013-4686 |
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NU @ karnesky @ |
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11057 |
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Kim, S. - J.; Ju, B. K.; Lee, Y. H.; Park, B. S.; Baik, Y. - J.; Lim, S.; Oh, M. H. |
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Emission characteristic of diamond-tip field emitter arrays fabricated by transfer mold technique |
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Journal Article |
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1997 |
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Journal of Vacuum Science & Technology A |
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J. Vac. Sci. Technol. A |
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B15 |
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499-502 |
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Field Emission |
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2480 |
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Kim, S.-H.; Lee, J.Y.; Ahn, J.-P.; Choi, P.-P. |
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Fabrication of Atom Probe Tomography Specimens from Nanoparticles Using a Fusible Bi-In-Sn Alloy as an Embedding Medium |
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Journal Article |
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2019 |
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Microscopy and Microanalysis |
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438-446 |
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atom probe tomography; fusible alloy; nanoparticles |
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We propose a new method for preparing atom probe tomography specimens from nanoparticles using a fusible bismuth-indium-tin alloy as an embedding medium. Iron nanoparticles synthesized by the sodium borohydride reduction method were chosen as a model system. The as-synthesized iron nanoparticles were embedded within the fusible alloy using focused ion beam milling and ion-milled to needle-shaped atom probe specimens under cryogenic conditions. An atom probe analysis revealed boron atoms in a detected iron nanoparticle, indicating that boron from the sodium borohydride reductant was incorporated into the nanoparticle during its synthesis. |
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Cambridge University Press |
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2019/02/04 |
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1431-9276 |
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NU @ karnesky @ |
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11534 |
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Kim, Y.-C.; Adusumilli, P.; Lauhon, L.J.; Seidman, D.N.; Jung, S.-Y.; Lee, H.-D.; Alvis, R.L.; Ulfig, R.M.; Olson, J.D. |
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Three-dimensional atomic-scale mapping of Pd in Ni[sub:1 - x]Pd[sub:x]Si/Si(100) thin films |
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Journal Article |
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2007 |
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Applied Physics Letters |
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Appl. Phys. Lett. |
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91 |
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113106:1-3 |
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annealing; interface roughness; nickel compounds; palladium compounds; rapid thermal processing; semiconductor-metal boundaries |
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Atom-probe tomography was utilized to map the three-dimensional distribution of Pd atoms in nickel monosilicide thin films on Si(100). A solid-solution Ni0.95Pd0.05 film on a Si(100) substrate was subjected to rapid thermal processing plus steady-state annealing to simulate the thermal processing experienced by NiSi source and drain contacts in standard complementary metal-oxide-semiconductor processes. Pd is found to segregate at the (Ni0.95Pd0.05)Si/Si(100) heterophase interface, which may provide a previously unrecognized contribution to monosilicide stabilization. The silicide-Si heterophase interface was reconstructed in three dimensions on an atomic scale and its chemical roughness was evaluated. |
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NU @ karnesky @ |
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9944 |
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Knipling, Keith E.; Karnesky, Richard A.; Lee, Constance P.; Dunand, David C.; Seidman, David N. |
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Precipitation Evolution in Al-0.1Sc, Al-0.1Zr, and Al-0.1Sc-0.1Zr (at.%) Alloys during Isochronal Aging |
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Journal Article |
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2010 |
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Acta Materialia |
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58 |
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15 |
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5184-5195 |
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Aluminum alloys, Precipitation, Scandium, Zirconium, Atom-probe tomography; Al-Sc-Zr |
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Precipitation strengthening is investigated in binary Al-0.1Sc, Al-0.1Zr, and ternary Al-0.1Sc-0.1Zr (at.%) alloys aged isochronally between 200 and 600 °C. A pronounced synergistic effect is observed when both Sc and Zr are present. Above 325 °C, where peak microhardness (670 MPa) occurs in the binary Al-Sc alloy due to Al[sub:3]Sc (L1[sub:2]) nanometer-scale precipitates, Zr additions result in a secondary increase in strength due to additional precipitation of Zr-enriched outer shells onto these precipitates. The ternary alloy reaches a peak microhardness of 780 MPa at 400 °C, delaying overaging by >100 °C compared with the binary Al-Sc alloy and increasing strength compared with the binary Al-Zr alloy (peak microhardness of 420 MPa at 425–450 °C). Compositions, radii, volume fractions, and number densities of the Al[sub:3](Sc[sub:1-x]Zr[sub:x]) precipitates are measured directly using atom-probe tomography. This information is used to quantify the observed strengthening increments, attributed to dislocation shearing of the Al[sub:3](Sc[sub:1-x]Zr[sub:x]) precipitates. |
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NU @ karnesky @ |
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10705 |
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Ko, C. G.; Ju, B. K.; Lee, Y. H.; Park, J. H.; Oh, M. H. |
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Fabrication and characterization of diamond-like carbon coated knife edge field emitter array |
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Journal Article |
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1996 |
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Japanese Journal of Applied Physics |
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Jpn. J. Appl. Phys. |
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35 |
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L1305-L1307 |
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Field Emission |
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2232 |
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Koops, P., H W; Kretz, J.; Rudolph, M.; Weber, M.; Dahm, G.; Lee, K. L. |
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Characterization and application of materials grown by electron-beam-induced deposition |
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Journal Article |
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1994 |
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Japanese Journal of Applied Physics |
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Jpn. J. Appl. Phys. |
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33 |
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7099-7107 |
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Scanning Tunnelling Microscopy |
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3083 |
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