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Type Bakhtizin, R. Z.; Valeev, V. G.; Kukharenko, Y. A.
  Publication Field emitted electron inelastic energy losses spectroscopy Volume Journal Article
Pages 1989
  Abstract Izv. Khim.  
  Corporate Author  
Publisher 22  
Editor (up)
  Summary Language Series Editor Addendum to Atom Probe Field Ion Microscopy and Related Topics: A Bibliography for 1978-1987, 1988, and 1989  
Abbreviated Series Title
  Series Issue ISSN  
Medium
  Expedition Notes  
Call Number  
Contribution Id  
Serial URL ISBN  
no 4419
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Bakhtizin, R. Z.; Valeev, V. G.; Shikhovtseva, E. S. Field emission current fluctuations related to the atomic diffusion on the metal surface Journal Article 1991 Poverkhnost 11 Field Emission no 4528
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Harvey, R. J.; Lee, R. A.; Miller, A. J.; Wigmore, J. K. Aspects of field emission from silicon diode arrays Journal Article 1991 IEEE Transactions on Electron Devices IEEE Trans. Electron Devices 38 Field Emission no 4547
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Lee, C. R. A., N A; Patel, C. Wet etching of cusp structures for field-emission devices Journal Article 1989 IEEE Trans. Electr. Devices 36 Field Emission no 4792
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Lee, M. J. G.; Robins, E. S. Thermal relaxation of a laser illuminated field emitter Journal Article 1989 Journal of Applied Physics J. Appl. Phys. 65 Field Emission no 4838
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Lee, R. A.; Patel, C.; Williams, H. A.; Cade, N. A. Semiconductor fabrication technology applied to micrometer valves Journal Article 1989 IEEE Trans. Electr. Devices 36 Field Emission no 4840
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Lee, H. C.; Huang, R. S. A study on field-emission array pressure sensors Journal Article 1992 Sens. Actuators A34 Field Emitters no 5076
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Gaudin, G. A.; Lee, G., M J Aggregates of chemisorbed copper on the (110) and (100) surfaces of tungsten Journal Article 1993 Surface Science Surf. Sci. 280 no 5301
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Lee, B.; Barasch, E. F.; Mazumdar, T.; McIntyre, P. M.; Pang, Y.; Trost, H. - J. Development of knife-edge field emission cathodes on (110) silicon wafers Journal Article 1993 Applied Surface Science Appl. Surf. Sci. 67 Field Emission Microscopy no 5390
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Howell, P. R.; Fleet, D. E.; Hildon, A.; Ralph, B. Field-ion microscopy of segregation to planar imperfections Journal Article 1976 J. Microsc. 107 grain boundaries; Field Ion Microscopy no 7056
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