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Type Lee, C. R. A., N A; Patel, C.
  Publication Wet etching of cusp structures for field-emission devices Volume Journal Article
Pages 1989
  Abstract IEEE Trans. Electr. Devices  
  Corporate Author  
Publisher 36  
Editor
  Summary Language Series Editor Field Emission  
Abbreviated Series Title
  Series Issue ISSN  
Medium
  Expedition Notes  
Call Number  
Contribution Id  
Serial (up) URL ISBN  
no 4792
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Cade, J. N. A., S E; Lee, R. A. Fabrication of sharp field emission structures using ion beam milling Book Chapter 1990 Vacuum Microelectronics, 1989 5-8 Field Emission Institute of Physics Bristol Turner, Roy E. 0854980555 no 4823
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Lee, M. J. G.; Robins, E. S. Thermal relaxation of a laser illuminated field emitter Journal Article 1989 Journal of Applied Physics J. Appl. Phys. 65 Field Emission no 4838
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Lee, R. A.; Miller, A. J.; Patel, C.; Williams, H. A. Construction and performance of field emitting cathodes Book Chapter 1990 Vacuum Microelectronics, 1989 105-108 Field Emission Institute of Physics Bristol Turner, Roy E. 0854980555 no 4839
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Lee, R. A.; Patel, C.; Williams, H. A.; Cade, N. A. Semiconductor fabrication technology applied to micrometer valves Journal Article 1989 IEEE Trans. Electr. Devices 36 Field Emission no 4840
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Lee, H. C.; Huang, R. S. A study on field-emission array pressure sensors Journal Article 1992 Sens. Actuators A34 Field Emitters no 5076
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Gaudin, G. A.; Lee, G., M J Aggregates of chemisorbed copper on the (110) and (100) surfaces of tungsten Journal Article 1993 Surface Science Surf. Sci. 280 no 5301
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Huang, L.; Lee, Y. H. Experimental method for preparing nanometer scale Pd probe Journal Article 1993 Review of Scientific Instruments Rev. Sci. Instrum. 64 10 3022-3023 Two-step electrochemical etching is used to fabricate a palladium microprobe having a tip diameter less than 20 nm. The first etching is done at 47 V in a solution containing 4:6 volume ratio of HCl:HNO3, while in the second the etching, low voltage pulses are used. no 5327
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Lee, B.; Barasch, E. F.; Mazumdar, T.; McIntyre, P. M.; Pang, Y.; Trost, H. - J. Development of knife-edge field emission cathodes on (110) silicon wafers Journal Article 1993 Applied Surface Science Appl. Surf. Sci. 67 Field Emission Microscopy no 5390
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Howell, P. R.; Fleet, D. E.; Hildon, A.; Ralph, B. Field-ion microscopy of segregation to planar imperfections Journal Article 1976 J. Microsc. 107 grain boundaries; Field Ion Microscopy no 7056
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