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Martin, Georges |
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Publication LIst of Georges Martin (2021) |
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Miscellaneous |
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2021 |
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Publication LIst of Georges Martin (2021) |
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NU @ isheim @ |
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11563 |
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Martin, Georges |
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Curriculum Vitae Georges Martin |
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Miscellaneous |
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2020 |
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CV; Curriculum Vitae |
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Curriculum Vitae Georges Martin |
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NU @ isheim @ |
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11561 |
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Martin, Georges |
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Solute Transfer at Interfaces |
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Manuscript |
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2003 |
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Autrans |
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NU @ karnesky @ |
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103 |
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Martin, M.L.; Somerday, B.P.; Ritchie, R.O.; Sofronis, P.; Robertson, I.M. |
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Hydrogen-induced intergranular failure in nickel revisited |
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Journal Article |
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2012 |
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Acta Materialia |
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In Press |
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Corrected Proof |
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Hydrogen embrittlement; Intergranular cracking; Transmission electron microscopy; Scanning electron microscopy; Nickel |
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Using a combination of high-resolution scanning and transmission electron microscopy, the basic mechanisms of hydrogen-induced intergranular fracture in nickel have been revisited. Focused-ion beam machining was employed to extract samples from the fracture surface to enable the examination of the microstructure immediately beneath it. Evidence for slip on multiple slip systems was evident on the fracture surface; immediately beneath it, an extensive dislocation substructure exists. These observations raise interesting questions about the role of plasticity in establishing the conditions for hydrogen-induced crack initiation and propagation along a grain boundary. The mechanisms of hydrogen embrittlement are re-examined in light of these new results. |
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1359-6454 |
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NU @ karnesky @ |
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11313 |
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Martin, N. L. S.; MacAdam, K. B. |
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Electric-field ionization of laser-excited Rydberg atoms in a magnetic field |
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Journal Article |
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1986 |
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Journal of Physics B: Atomic and Molecular Physics |
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J. Phys. B |
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3642 |
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Martinez, E.; Fu, C.-C.; Levesque, M.; Nastar, M.; Soisson, F. |
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Simulations of decomposition kinetics of Fe-Cr solid solutions during thermal aging |
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Journal Article |
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2011 |
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Solid State Phenomena |
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172-174 |
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1016 |
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cond-mat.mtrl-sci; cond-mat.stat-mech; physics.comp-ph |
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The decomposition of Fe-Cr solid solutions during thermal aging is modeled by Atomistic Kinetic Monte Carlo (AKMC) simulations, using a rigid lattice approximation with composition dependant pair interactions that can reproduce the change of sign of the mixing energy with the alloy composition. The interactions are fitted on ab initio mixing energies and on the experimental phase diagram, as well as on the migration barriers in iron and chromium rich phases. Simulated kinetics is compared with 3D atom probe and neutron scattering experiments. |
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arXiv:1102.1091v1; 6 pages, 5 figures, PTM 2010 |
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NU @ karnesky @ |
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11018 |
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Martinez, E.; Ronsheim, P.; Barnes, J.-P.; Rochat, N.; Py, M.; Hatzistergos, M.; Renault, O.; Silly, M.; Sirotti, F.; Bertin, F.; Gambacorti, N. |
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Lanthanum diffusion in the TiN/LaOx/HfSiO/SiO2/Si stack |
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Journal Article |
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2011 |
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Microelectronic Engineering |
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Proceedings of the 17th Biennial International Insulating Films on Semiconductor Conference, 17th Bi |
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88 |
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1349-1352 |
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Metal/high-k stack; TiN; HfSiO; La; Interfacial dipole; Threshold voltage tuning; ToF-SIMS; Apt; Atr-Ftir; S-Xps |
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Band edge Complementary Metal Oxide Semiconductor (CMOS) devices are obtained by insertion of a thin LaOx layer between the high-k (HfSiO) and metal gate (TiN). High temperature post deposition anneal induces Lanthanum diffusion across the HfSiO towards the SiO2 interfacial layer, as shown by Time of Flight Secondary Ions Mass Spectroscopy (ToF-SIMS) and Atom Probe Tomography (APT). Fourier Transform Infrared Spectroscopy in Attenuated Total Reflexion mode (ATR-FTIR) shows the formation of La-O-Si bonds at the high-k/SiO2 interface. Soft X-ray Photoelectron Spectroscopy (S-XPS) is performed after partial removal of the TiN gate. Results confirm La diffusion and changes in the La chemical environment. |
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0167-9317 |
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NU @ karnesky @ |
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11170 |
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Martinka, M. |
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Surface distributions of hydrogen field adsorbed on rhodium as displayed by imaging atom probe |
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Journal Article |
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1981 |
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Surface Science |
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Surf. Sci. |
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109 |
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atom probe field ion microscopy |
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8040 |
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Martinka, M. |
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The high resolution imaging atom-probe with application to nickel platings |
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Journal Article |
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1981 |
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Univ. Microfilms Int., Order No. 8112823 (1981) |
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8041 |
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Martinka, M. |
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The high resolution imaging atom-probe with application to nickel platings |
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Journal Article |
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1980 |
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ARLPSUTM0-80-242, Order No. AD-A095 254 (1980) |
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7828 |
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