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Type Sarrau, J. M.; Bostel, A.; Martin, C.; Gallot, J. C. R.
  Publication Atom probe determination of time of flight in a hyperboloidal sample model (French) Volume Journal Article
Pages 1976
  Abstract C. R. Hebd. Seances Acad. Sci. B  
  Corporate Author  
Publisher 283  
Editor
  Summary Language Series Editor calibration and charge state studies; atom probe field ion microscopy  
Abbreviated Series Title
  Series Issue ISSN  
Medium
  Expedition Notes  
Call Number (up)  
Contribution Id  
Serial URL ISBN  
no 7108
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Deconihout, B.; Saint-Martin, R.; Jamot, C.; Bostel, A. Improvement of the mass resolution of the atom probe using a dual counter-electrode Journal Article 2003 Ultramicroscopy 95 239-249 no 9199
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Menand, A.; Martin, C.; Sarrau, J. M. Field evaporation charge state of boron ions: a temperature effect study Journal Article 1984 Journal de Physique J. de Phys. 45-C9 no 8612
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Martin, C.; Blavette, D.; Sarrau, J. M. Performance of a time-of-flight atom probe Journal Article 1984 Rev. Phys. Appl. 19 atom probe field ion microscopy no 8604
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Menand, A.; Bouet, M.; Martin, C.; Gallot, J. Atom probe study of iron-boron (Fe-B) amorphous alloys Book Chapter 1982 Proc. 29th IFES, Gothenburg atom probe field ion microscopy Almqvist and Wiksell Stockholm Andren, H.-O.; Norden, H. no 8239
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Melmed, A. J.; Martinka, M.; Klein, R. A general purpose atom probe field ion microscope Book Chapter 1982 Proc. 29th IFES, Gothenburg atom probe field ion microscopy Almqvist and Wiksell Stockholm Andren, H.-O.; Norden, H. no 8238
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Blavette, D.; Martin, C.; Gallot, J. Atomic probe analysis of precipitates in an iron-chromium-nickel-aluminum (FeCr20Ni2Al2) alloy Journal Article 1982 Scr. Metall. 16, atom probe field ion microscopy no 8124
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Melmed, A. J.; Martinka, M.; Girvin, S. M.; Sakurai, T.; Kuk, Y. Analysis of high resistivity semiconductor specimens in an energy-compensated time-of-flight atom probe Journal Article 1981 Applied Physics Letters Appl. Phys. Lett. 39 atom probe field ion microscopy no 8042
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Martinka, M. The high resolution imaging atom-probe with application to nickel platings Journal Article 1981 Univ. Microfilms Int., Order No. 8112823 (1981) no 8041
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Martinka, M. Surface distributions of hydrogen field adsorbed on rhodium as displayed by imaging atom probe Journal Article 1981 Surface Science Surf. Sci. 109 atom probe field ion microscopy no 8040
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