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Sarrau, J. M.; Martin, C.; Bostel, A.; Gallot, J. C. R. |
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Publication |
A spectral resolution method for an atom probe field ion microscope (French) |
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Journal Article |
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1976 |
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Abstract |
C. R. Hebd. Seances Acad. Sci. B |
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282 |
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Series Editor |
associated instrumentation; atom probe field ion microscopy |
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7107 |
| Permanent link to this record |
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Sarrau, J. M.; Bostel, A.; Martin, C.; Gallot, J. C. R. |
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Atom probe determination of time of flight in a hyperboloidal sample model (French) |
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Journal Article |
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1976 |
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C. R. Hebd. Seances Acad. Sci. B |
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283 |
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calibration and charge state studies; atom probe field ion microscopy |
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7108 |
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Krishnaswamy, S. V.; Martinka, M.; Müller, E. W. |
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Multilayer field evaporation patterns |
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Journal Article |
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1977 |
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Surface Science |
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Surf. Sci. |
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64 |
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imaging atom probe and applications; Atom Probe Field Ion Microscopy |
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7200 |
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Sarrau, J. M.; Bostel, A.; Martin, C.; Gallot, J. C. R. |
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Atom probe: experimental results on tungsten and iron-aluminium alloy samples (French) |
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Journal Article |
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1978 |
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C. R. Hebd. Seances Acad. Sci. B |
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286 |
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metallurgical applications; atom probe field ion microscopy |
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7333 |
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Sarrau, J. M.; Bostel, A.; Martin, C.; Gallot, J. C. R. |
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Atom probe: experimental results on tungsten and iron-aluminum alloy samples |
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Journal Article |
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1978 |
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C. R. Hebd. Seances Acad. Sci., Ser. B |
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286, |
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atom probe field ion microscopy |
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7498 |
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Martinka, M. |
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The high resolution imaging atom-probe with application to nickel platings |
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Journal Article |
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1980 |
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ARLPSUTM0-80-242, Order No. AD-A095 254 (1980) |
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7828 |
| Permanent link to this record |
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Melmed, A. J.; Martinka, M.; Sakurai, T.; Kuk, Y. |
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Analysis of high resistivity silicon in a energy-compensated ToF atom-probe |
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Book Chapter |
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1980 |
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Proc. 27th IFES, Tokyo |
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Univ. of Tokyo |
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Tokyo |
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Yashiro, Y.; Igata, N. |
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7832 |
| Permanent link to this record |
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Sarrau, J. M.; Martin, C.; Bostel, A.; Gallot, J. C. R. |
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Atom probes: relationship between results of analysis and structure of a sample |
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Journal Article |
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1980 |
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C. R. Hebd. Seances Acad. Sci. B |
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290 |
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63-66 |
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atom probe field ion microscopy |
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7886 |
| Permanent link to this record |
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Martinka, M. |
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Surface distributions of hydrogen field adsorbed on rhodium as displayed by imaging atom probe |
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Journal Article |
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1981 |
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Surface Science |
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Surf. Sci. |
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109 |
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atom probe field ion microscopy |
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8040 |
| Permanent link to this record |
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Martinka, M. |
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The high resolution imaging atom-probe with application to nickel platings |
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Journal Article |
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1981 |
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Univ. Microfilms Int., Order No. 8112823 (1981) |
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8041 |
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