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Type Martin, N. L. S.; MacAdam, K. B.
  Publication Electric-field ionization of laser-excited Rydberg atoms in a magnetic field Volume Journal Article
Pages 1986
  Abstract Journal of Physics B: Atomic and Molecular Physics  
  Corporate Author J. Phys. B  
Publisher 19  
Editor
  Summary Language Series Editor (up)  
Abbreviated Series Title
  Series Issue ISSN  
Medium
  Expedition Notes  
Call Number  
Contribution Id  
Serial URL ISBN  
no 3642
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Menand, A.; Chambreland, S.; Martin, C. Atom probe study of titanium base alloys: preliminary results Journal Article 1986 Journal de Physique J. de Phys. 47-C2 atom probe field ion microscopy no 3651
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Hadjadj, L.; Menand, A.; Martin, C. Atom probe study of a Ti-10V-2Fe-3Al alloy: preliminary results Journal Article 1987 Journal de Physique J. de Phys. 48-C6 atom probe field ion microscopy no 3825
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Hopgood, A. A.; Nicholls, A.; Smith, G. D. W.; Martin, J. W. Effects of heat treatment on phase chemistry and microstructure of single crystal nickel base superalloy Journal Article 1988 Materials Science and Technology Mater. Sci. Tech. 4 no 4086
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Menand, A.; Martin, C.; Gallot, J. Description of a field ion microscope (French) Journal Article 1972 Rev Phys Appl 7 construction; Field Ion Microscopy no 6487
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Martin, A.; Block, J. A field ion source with electrical mass filter Journal Article 1973 Messtechnik 81 field desorption; Field Evaporation no 6619
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Cetronio, A.; Jones, J. P.; Martin, A. D. Computer simulation of ion images as an aid to indexing small crystallites Journal Article 1974 Surface Science Surf. Sci. 44 computer simulation; Field Ion Microscopy no 6715
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Jones, J. P.; Martin, A. D. High field microscopy of nickel on tungsten Journal Article 1974 Surface Science Surf. Sci. 41 thin film nucleation; Field Ion Microscopy no 6758
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Sarrau, J. M.; Martin, C.; Gallot, J. An atom probe field ion microscope calibrated using tantalum a single isotope metal (French) Journal Article 1975 C. R. Hebd. Seances Acad. Sci. B 281 calibration and charge state studies; atom probe field ion microscopy no 6959
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Walls, J. M.; Martin, A. D.; Southworth, H. N. Combined FIM AES and LEED study of the structure and composition of ion- bombarded W surfaces Journal Article 1975 Surface Science Surf. Sci. 50 low energy ion bombardment; Field Ion Microscopy no 6984
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