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Records |
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Liu, J.; Zhirnov, V. V.; Wojak, G. J.; Meyers, A. F.; Choi, W. B.; Hren, J. J.; Wolter, S. D.; McClure, M. T.; Stoner, B. R.; Glass, J. |
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Publication |
Electron emission from diamond coated silicon field emitters |
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Journal Article |
Pages |
1994 |
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Abstract |
Applied Physics Letters |
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Corporate Author |
Appl. Phys. Lett. |
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Publisher |
65 |
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Summary Language |
2842-2844 |
Series Editor |
Field Emission |
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3128 |
| Permanent link to this record |
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Hren, J. J.; Liu, J. |
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Field emission, field ion microscopy, and the atom probe |
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Journal Article |
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1994 |
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Microanal. Solids, B. G.Yacobi, D.B. Holt, and L.L. Kazmerski, eds., Plenum Publishing, New York, NY (1994) 359-87 |
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359-387 |
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atom probe field ion microscopy |
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3168 |
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Hyde, J. M.; Cerezo, A.; Setna, R. P.; Warren, P. J.; Smith, W., G D |
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Lateral and depth scale calibration of the position sensitive atom probe |
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Journal Article |
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1994 |
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Applied Surface Science |
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Appl. Surf. Sci. |
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76/77 |
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382-391 |
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atom probe field ion microscopy |
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3239 |
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Liu, J.; Son, U. T.; Stepanova, A. N.; Christensen, K. N.; Wojak, G. J.; Givargizov, E. I.; Bachmann, K. J.; Hren, J. J. |
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Modification of Si field emitter surfaces by chemical conversion to SiC |
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Journal Article |
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1994 |
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Journal of Vacuum Science & Technology A |
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J. Vac. Sci. Technol. A |
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B12 |
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717-721 |
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Field Emission |
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3267 |
| Permanent link to this record |
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Josefsson, B.; Andren, H. - O. |
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Reply to discussion by H.I. Aaronson and W.T. Reynolds to "Atom probe field ion microscopy of bainitic transformation in 2.25Cr-1Mo weld metal" |
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Journal Article |
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1994 |
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Scripta Metallurgica et Materialia |
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Scripta Metall. Mater. |
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30 |
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269-270 |
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atom probe field ion microscopy |
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3326 |
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Hu, Q. - H.; Stiller, K.; Olsson, E.; Andren, H. - O.; Berastegui, P.; Johansson, G. |
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Synthesis and atom probe microanalysis of YBa2Cu306+d ceramics |
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Journal Article |
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1994 |
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Physica C |
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235-240 |
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431-432 |
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atom probe field ion microscopy |
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3362 |
| Permanent link to this record |
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Barengolts, S. A.; Litvinov, E. A.; Imoanov, I. V. |
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Thin superconducting films at field emission |
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Book Chapter |
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1994 |
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Proc. XVI Intern. Symp. Discharges and Electrical Insulation in Vacuum |
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464-468 |
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Field Emission |
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Meystats, G. A. |
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3389 |
| Permanent link to this record |
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Mousa, M. S.; Lorenz, K.; Xu, N. S. |
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In situ observation of the transition process from cold to hot electron emission during field emission assisted vacuum depeosition of polymer on W tips |
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Journal Article |
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1999 |
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Ultramicroscopy |
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79 |
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43-49 |
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Field Emission |
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3415 |
| Permanent link to this record |
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Cerezo, A.; Warren, P. J.; Smith, W., G D |
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Some aspects of image projection in the field-ion microscope |
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Journal Article |
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1999 |
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Ultramicroscopy |
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79 |
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251-257 |
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Field Ion Microscopy |
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3443 |
| Permanent link to this record |
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Böttger, A.; vanGenderen, J. J.; Sijbrandij, S. J.; Mettemeijer, E. J.; Smith, W., G D |
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Atom probe and x-ray diffraction analysis of the composition and structure of precipitates formed on tempering of ternary iron-carbon-nitrogen martensites |
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Journal Article |
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1996 |
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ISIJ Int. |
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36 |
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764-767 |
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Atom Probe Field Ion Microscopy |
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no |
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3453 |
| Permanent link to this record |
