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Type Brenner, S. S.; Mckinney, J. T.
  Publication The performance of electron multipliers in FIM atom probes Volume Journal Article
Pages 1972
  Abstract Review of Scientific Instruments  
  Corporate Author Rev. Sci. Instrum.  
Publisher 43  
Editor
  Summary Language Series Editor associated instrumentation; atom probe field ion microscopy  
Abbreviated Series Title
  Series Issue ISSN  
Medium
  Expedition Notes  
Call Number (up)  
Contribution Id  
Serial URL ISBN  
no 6448
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Grenga, H. E.; Kumar, R. Hydrogen-ion microscopy of titanium Journal Article 1972 Surface Science Surf. Sci. 29 metals; Field Ion Microscopy no 6474
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Hren, J. J.; Moore, A. J. W.; Spink, J. A. Anomalous FIM images of tungsten Journal Article 1972 Surface Science Surf. Sci. 29 image contrast; Field Ion Microscopy no 6478
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Ranganathan, B. N.; Grenga, H. E. Field ion microscopy of ferrous martensite Journal Article 1972 Phil. Mag. 26 alloys - ferrous studies; Field Ion Microscopy no 6505
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Brent, D. A.; Rouse, D. J.; Sammons, M. C.; Bursey, M. M. Field desorption mass spectrometry Quaternary ammonium salts Journal Article 1973 Tetrahedron Lett 42 inorganic compounds; Field Desorption Mass Spectrometry no 6566
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Charkabortty, S.; Grenga, H. E. Adsorption of carbon monoxide on ruthenium Journal Article 1973 Journal of Applied Physics J. Appl. Phys. 44 gas surface interactions; Field Ion Microscopy no 6570
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French, R. D.; Bishop, G. H. Reply to "comments on "Grain boundary contrast in field ion microscope images Journal Article 1973 Journal of Applied Physics J. Appl. Phys. 44 grain boundaries; Field Ion Microscopy no 6583
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Garber, R. I.; Lazarev, B. G.; Lazareva, L. S.; Mikhailovskii, I. M.; Sidorenko, N. N. Field ion microscopic study of the microstructure of superconducting deformable niobium alloys Journal Article 1973 Sov Phys -Jetp 36 alloys - nonferrous studies; Field Ion Microscopy no 6585
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Garber, R. I.; Lazarev, B. G.; Lazareva, L. S.; Kulko, V. B.; I.M Mikhailovskii,; Sidorenko, N. N. Study of the superconducting alloy NbTi with the aid of an autoionic microanalyzer (Russian) Journal Article 1973 Vopr At Nauhi Tekh Ser Fundam & Prihl Sverkhprovodimost 1 alloys - short and long range order; Field Ion Microscopy no 6586
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Goldenfeld, I. V.; Bondarenko, R. N. Filamentary metallic emitters having a developed surface Journal Article 1973 Prib Tekh Eksp 16 specimen preparation; Field Ion Microscopy no 6590
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