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Grenga, H.; Hochman, R. |
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Publication |
Gas-metal interactions field ion and field emission microscopy |
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Book Chapter |
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1969 |
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Abstract |
Appl. of Field Ion Microsc. in Physical Metallurgy and Corrosion |
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Summary Language |
391 |
Series Editor |
gas surface interactions; Field Ion Microscopy |
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Georgia Tech Press |
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Atlanta, GA |
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Hochman, R. F.; et al. |
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6090 |
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Sauvage, X.; Renaud, L.; Deconihout, B.; Blavette, D.; Ping, D. H.; Hono, K. |
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Solid state amorphization in cold drawn Cu/Nb wires |
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Journal Article |
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2001 |
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Acta Materialia |
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Acta Mater. |
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49 |
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389-394 |
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9027 |
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Grant, S. P.; Earp, S. L.; Brenner, S. S.; Burke, M. G. |
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Phenomenological modeling of radiation embrittlement in light water reactor vessels with atom probe and statistical analysis |
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Journal Article |
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1986 |
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Proc. Intl. Symp. Environ. Degrad. Mater. Nucl. Power Syst.-Water React., 2nd, , Am. Nucl. Soc., La Grange Park, IL (1986) 385-392 |
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385-392 |
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neutron irradiation pressure vessel steel APFIM; atom probe field ion microscopy |
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3553 |
| Permanent link to this record |
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Hyde, J. M.; Cerezo, A.; Setna, R. P.; Warren, P. J.; Smith, W., G D |
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Lateral and depth scale calibration of the position sensitive atom probe |
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Journal Article |
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1994 |
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Applied Surface Science |
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Appl. Surf. Sci. |
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76/77 |
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382-391 |
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atom probe field ion microscopy |
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3239 |
| Permanent link to this record |
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Current, Michael I.; Seidman, David N. |
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Sputtering of tungsten: a direct view of a near surface depleted zone created by a single 30 keV63 Cu+ projectile |
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Journal Article |
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1980 |
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Nuclear Instruments and Methods |
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170 |
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1-3 |
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377-381 |
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The vacancy structure of near-surface depleted zone (DZ), created by a single 30 keV 63Cu+ ion in a tungsten field-ion microscope (FIM) specimen, was determined with atomic resolution. Both the irradiation and pulse field-evaporation experiments were performed in situ at less, approximate11 K, so that the observed vacancy structure was unaltered by the long-range migration of self-interstitial atoms. The following basic physical quantities were measured: (1) the number of vacancies; (2) the dimensions; (3) the vacancy concentration; (4) the distribution of first-nearest-neighbor vacancy clusters; and (5) the radial-distribution function for the vacancies out to ninth-nearest neighbor. The values of these quantitieswere shown to be similar for both the near-surface DZ and DZs created in the bulk of the same specimen by 30 keV 63Cu+ projectiles. |
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8862 |
| Permanent link to this record |
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Kelly, T. E.; Gribb, T. T.; Olson, J. D.; Martens, R. L.; Shepard, J. D.; Wiener, S. A.; Kunicki, T. C.; Ulfig, R. M.; Lenz, D. R.; Strennen, E. M.; Oltman, E.; Bunton, J. H.; Strait, D. R. |
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First Data from a Commercial Local Electrode Atom Probe (LEAP) |
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Journal Article |
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2004 |
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Microscopy and Microanalysis |
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10 |
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3 |
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373-383 |
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atom probe; LEAP; local electrode atom probe; microanalysis; nanoscale analysis; 3D imaging |
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The first dedicated local electrode atom probes (LEAP [a trademark of Imago Scientific Instruments Corporation]) have been built and tested as commercial prototypes. Several key performance parameters have been markedly improved relative to conventional three-dimensional atom probe (3DAP) designs. The Imago LEAP can operate at a sustained data collection rate of 1 million atoms/minute. This is some 600 times faster than the next fastest atom probe and large images can be collected in less than 1 h that otherwise would take many days. The field of view of the Imago LEAP is about 40 times larger than conventional 3DAPs. This makes it possible to analyze regions that are about 100 nm diameter by 100 nm deep containing on the order of 50 to 100 million atoms with this instrument. Several example applications that illustrate the advantages of the LEAP for materials analysis are presented. |
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refbase @ user |
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1270 |
| Permanent link to this record |
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Burke, M. G.; Brenner, S. S. |
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Applications of atom-probe field-ion microscopy to segregation and clustering studies in materials science |
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Journal Article |
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1986 |
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Microbeam Anal. |
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21 |
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363-369 |
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APFIM segregation clustering |
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3504 |
| Permanent link to this record |
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Hren, J. J.; Liu, J. |
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Field emission, field ion microscopy, and the atom probe |
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Journal Article |
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1994 |
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Microanal. Solids, B. G.Yacobi, D.B. Holt, and L.L. Kazmerski, eds., Plenum Publishing, New York, NY (1994) 359-87 |
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359-387 |
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atom probe field ion microscopy |
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3168 |
| Permanent link to this record |
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Dong, Y.; Etienne, A.; Frolov, A.; Fedotova, S.; Fujii, K.; Fukuya, K.; Hatzoglou, C.; Kuleshova, E.; Lindgren, K.; London, A.; Lopez, A.; Lozano-Perez, S.; Miyahara, Y.; Nagai, Y.; Nishida, K.; Radiguet, B.; Schreiber, D.K.; Soneda, N.; Thuvander, M.; Toyama, T.; Wang, J.; Sefta, F.; Chou, P.; Marquis, E.A. |
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Atom Probe Tomography Interlaboratory Study on Clustering Analysis in Experimental Data Using the Maximum Separation Distance Approach |
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Journal Article |
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2019 |
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Microscopy and Microanalysis |
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25 |
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2 |
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356-366 |
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atom probe tomography; cluster analysis; maximum separation |
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We summarize the findings from an interlaboratory study conducted between ten international research groups and investigate the use of the commonly used maximum separation distance and local concentration thresholding methods for solute clustering quantification. The study objectives are: to bring clarity to the range of applicability of the methods; identify existing and/or needed modifications; and interpretation of past published data. Participants collected experimental data from a proton-irradiated 304 stainless steel and analyzed Cu-rich and Ni-Si rich clusters. The datasets were also analyzed by one researcher to clarify variability originating from different operators. The Cu distribution fulfills the ideal requirements of the maximum separation method (MSM), namely a dilute matrix Cu concentration and concentrated Cu clusters. This enabled a relatively tight distribution of the cluster number density among the participants. By contrast, the group analysis of the Ni-Si rich clusters by the MSM was complicated by a high Ni matrix concentration and by the presence of Si-decorated dislocations, leading to larger variability among researchers. While local concentration filtering could, in principle, tighten the results, the cluster identification step inevitably maintained a high scatter. Recommendations regarding reporting, selection of analysis method, and expected variability when interpreting published data are discussed. |
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Cambridge University Press |
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2019/02/04 |
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1431-9276 |
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NU @ karnesky @ |
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11537 |
| Permanent link to this record |
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Wang, Q.; Kinkus, T. J.; Ren, D. G. |
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Markov process analysis of atom probe data |
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Journal Article |
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1990 |
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Chinese Physics Letters |
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Chin. Phys. Lett. |
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7 |
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8 |
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353 |
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atom probe field ion microscopy |
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A geometry model of field evaporation process is set up; with this model the field evaporation process can be described as Markov process. Its application to the earliest stage of phase transition is studied. For comparison, Camus' system Fe-Cr 45 at.% is calculated agin, and the same result is extracted from our method and intimated in our experimental data. |
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4291 |
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