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Macrander, Albert T.; Yamamoto, Masahiko; Seidman, David N.; Brenner, S. S. |
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Statistics of the atom-by-atom dissection of planes in an atom-probe field-ion microscope: The number of atoms detected per plane |
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Journal Article |
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1983 |
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Abstract |
Review of Scientific Instruments |
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Corporate Author |
Rev. Sci. Instrum. |
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54 |
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9 |
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Summary Language |
1077-1084 |
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DNS-quantitative |
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Abbreviated Series Title |
The statistics of the atom-by-atom dissection of planes, in the atom-probe field-ion microscope, have been investigated. Tungsten specimens oriented in the [110] direction, with the probe hole over the center of the plane, were slowly pulsed field-evaporated on a plane-by-plane basis, and statistical analyses were made on the number of tungsten atoms detected per plane; 30 separate slow dissection experiments were performed. Observed fluctuations in the number of atoms per plane are used to infer a range of allowable values for the detection efficiency. We find that, in some cases, the number of atoms per plane can be described as following a binomial distribution. From these results detection efficiencies in the range 0.11 to 0.54 were inferred. This range of efficiencies can be understood with the aid of field-ion desorption images. In addition, a value for the detection efficiency of 0.2 was obtained under the assumption that all atoms in the area projected by the probe hole, along the specimen radius, were analyzed. Thus, we find that this geometrical procedure, a first-order approach to the problem, yields a reasonable result. Also, the results of a Monte Carlo simulation of atom-by-atom field evaporation of a large number of planes are presented. The Monte Carlo simulation shows that if a binomial distribution is obtained, the uncertainty in concentrations determined by the atom-probe technique will have only a small component owing to the uncertainty in the number of solvent specimen atomsthis is subject to the caveat that there are no special problems with the field-evaporation behavior of the solvent atoms. Although the statistical analyses were applied to a specific crystallographic plane and position, the methodology is reasonably general and can be applied to other situations. |
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NU @ karnesky @ |
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Seto, K.; Larson, D. J.; Warren, P. J.; Smith, G. D. W. |
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Grain Boundary Segregation in Boron Added Interstitial Free Steels Studied by 3-Dimensional Atom Probe |
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Journal Article |
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1999 |
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Scripta Materialia |
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Scripta Mater. |
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40 |
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9 |
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1029-1034 |
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Technical Research Laboratories, Kawasaki Steel Corporation & Department of Materials, Oxford University |
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Elsevier |
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English |
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NU @ p-kolli @ |
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259 |
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Seto, K.; Larson, D. J.; Warren, P. J.; Smith, W., G D |
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Grain boundary segregation in boron added interstitial free steels studied by 3-dimensional atom probe |
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Journal Article |
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1999 |
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Scripta Materialia |
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Scripta Mater. |
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40 |
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1029-1034 |
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3D Atom Probe, Steels |
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2398 |
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Miller, M. K.; Beaven, P. A.; Brenner, S. S.; Smith, G. D. W. |
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An atom probe study of the aging of iron-nickel-carbon martensite |
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Journal Article |
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1983 |
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Metall. Trans. A |
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14, |
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1021-1024 |
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martensite Fe-Ni-C APFIM aging; atom probe field ion microscopy |
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8413 |
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Myers, A. F.; Choi, W. B.; Cuomo, J. J.; Hren, J. J. |
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Electron microscopy investigation of Si and Mo field emitters coated with daimond powder by dielectrophoresis |
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Book Chapter |
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1996 |
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Proceedings: Microscopy and Microanalysis |
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958-959 |
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Field Emission |
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San Francisco Press |
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Bailey, G. W. |
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2268 |
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Brenner, S. S.; Kellogg, G. L. |
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Atom probe microanalysis of superconducting YBa[sub:2]Cu[sub:3]O[sub:7-x] |
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Journal Article |
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1988 |
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Materials Research Society Symposium Proceedings |
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Mater. Res. Soc. Symp. Proc. |
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99 |
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947-950 |
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123 high Tc superconductor APFIM; atom probe field ion microscopy |
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Superconducting YBa2Cu3O7Tx needles prepared from hot-pressed discs of oxide
powders were analyzed in a long drift-tube type atom probe. An analyses was made
from a randomly located area about 2 nm in diameter. Most of the oxygen field-
evaporated as 02+ ions. The measured composition agreed well with that of
YBa 2 Cu 3 O6 .5 except for yttrium which was found to be too high. The oxygen
concentration profile showed fluctuations about 2.5 nm apart which must still be
clarified. |
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4029 |
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Juraszek, J.; Grenier, A.; Teillet, J.; Cadel, E.; Tiercelin, N.; Monnet, I.; Toulemonde, M. |
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Atom probe tomography of swift ion irradiated multilayers |
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Journal Article |
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2009 |
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Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms |
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267 |
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6 |
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912-916 |
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Ion beam mixing; atom probe tomography; multilayers; swift ion irradiation |
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Nanometer scale layered systems are well suited to investigate atomic transport processes induced by high-energy electronic excitations in materials, through the characterization of the interface transformation. In this study, we used the atom probe technique to determine the distribution of the different elements in a (amorphous-Fe2Tb 5 nm/hcp-Co 3 nm)20 multilayer before and after irradiation with Pb ions in the electronic stopping power regime. Atom probe tomography is based on reconstruction of a small volume of a sharp tip evaporated by field effect. It has unique capabilities to characterize internal interfaces and layer chemistry with sub-nanometer scale resolution in three dimensions. Depth composition profiles and 3D element mapping have been determined, evidencing for asymmetric interfaces in the as-deposited sample, and very efficient Fe-Co intermixing after irradiation at the fluence 7×1012 ion cm-2. Estimation of effective atomic diffusion coefficients after irradiation suggests that mixing results from interdiffusion in a molten track across the interface in agreement with the thermal spike model. |
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0168-583x |
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NU @ karnesky @ |
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10581 |
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VanGenderen, M. J.; Sijbrandij, S. J.; Böttger, A.; Mittemeijer, E. J.; Smith, W., G D |
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Atom probe analysis of initial decomposition of Fe-N martensite |
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Journal Article |
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1997 |
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Materials Science and Technology |
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Mater. Sci. Tech. |
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13 |
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806-812 |
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Atom Probe Field Ion Microscopy |
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2637 |
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Zhang, Y.; Warren, P. J.; Cerezo, A.; Harland, C. L.; Davies, H. A. |
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Partitioning behavior and the effect of Co on the Curie temperature of nanocomposite PrFeCoB hard magnetic alloys |
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Journal Article |
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2001 |
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Applied Physics Letters |
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Appl. Phys. Lett. |
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79 |
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797 |
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9071 |
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Mohamed, Farghalli A.; Langdon, Terence G. |
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The transition from dislocation climb to viscous glide in creep of solid solution alloys |
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Journal Article |
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1974 |
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Acta Metallurgica |
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22 |
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6 |
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779-788 |
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There are two distinct and separate classes of creep behavior in metallic solid solution alloys. The mechanism of creep in Class I alloys appears to be some form of dislocation climb process, whereas the mechanism in Class II alloys appears to be a viscous glide process. By making assumptions concerning the nature of the climb and glide processes, and using existing experimental results for an Al-3% Mg alloy, it is shown that, to a, first approximation, the criterion for deformation by viscous glide is given by
Image
where B not, vert, similar 8 × 1012, σ is the applied stress, k is Boltzmann's constant, v is Poisson's ratio, γ is the stacking fault energy, G is the shear modulus, b is the Burgers vector, T is the absolute temperature, e is the solute-solvent size difference, and c is the concentration of solute atoms. The creep behavior of twenty-eight different solid solution alloys is analyzed, and it is shown that all alloys except one (Au-10% Ni) give results which are consistent with this criterion for viscous glide. |
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NU @ karnesky @ |
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307 |
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