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Records |
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Brenner, S. S.; Mckinney, J. T. |
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Publication |
FIM atom probe analysis of individual image spots caused by gas adsorption |
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Journal Article |
Pages |
1970 |
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Abstract |
Surface Science |
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Corporate Author |
Surf. Sci. |
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20 |
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Summary Language |
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Series Editor |
surface reactions; atom probe field ion microscopy |
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6199 |
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Goldenfeld, I. V.; Nazarenko, V. A. |
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Current-voltage characteristics and angular distribution of the ions in field ionisation |
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Journal Article |
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1970 |
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International Journal of Mass Spectrometry and Ion Physics |
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Int. J. Mass Spectrom. Ion Phys. |
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5 |
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current-voltage characteristics; Field Ionization |
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6222 |
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Jenkins, D. A.; Hren, J. J. |
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Metal tip for field ion microscope |
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Journal Article |
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1970 |
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Review of Scientific Instruments |
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Rev. Sci. Instrum. |
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41 |
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current-voltage characteristics; Field Ionization |
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6229 |
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Nazarenko, V. A. |
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Calculation of the current voltage characteristics of a field ion microscope |
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Journal Article |
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1970 |
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International Journal of Mass Spectrometry and Ion Physics |
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Int. J. Mass Spectrom. Ion Phys. |
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5 |
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construction and design; Atom Probe Field Ion Microscopy |
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6252 |
| Permanent link to this record |
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Rendulic, K. D. |
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A comparison between FIM and LEED studies of surface reconstruction |
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Journal Article |
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1970 |
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Surface Science |
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Surf. Sci. |
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21 |
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surface structure; Field Ion Microscopy |
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6267 |
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Rendulic, K. D.; Müller, E. W. |
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Optical transformation of field ion micrographs |
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Journal Article |
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1970 |
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Review of Scientific Instruments |
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Rev. Sci. Instrum. |
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41 |
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image projection; Field Ion Microscopy |
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6268 |
| Permanent link to this record |
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Sharma, S. P.; Schrenk, G. L. |
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Effect of periodic surface potential variation on high field tunneling in field ionisation process |
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Journal Article |
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1970 |
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Phys Rev B |
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2 |
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field ionisation theory and processes; Field Ionization |
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6276 |
| Permanent link to this record |
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Son, U. T.; Hren, J. J. |
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Field ion microscopy of Frank loops in platinum: Computer simulation and experimental observation |
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Journal Article |
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1970 |
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Phil. Mag. |
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22 |
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dislocations and slip; Field Ion Microscopy |
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6280 |
| Permanent link to this record |
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Brenner, S. S.; Goodman, S. R. |
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FIM-atom probe analysis of thin nitride platelets in Fe-3 at per cent Mo |
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Journal Article |
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1971 |
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Scripta Met |
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5 |
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metallurgical applications; Atom Probe Field Ion Microscopy |
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6320 |
| Permanent link to this record |
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Brenner, S. S.; Goodman, S. R. |
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FIM-atom probe studies of clustering and precipitation in iron alloys |
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Journal Article |
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1971 |
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Proc. Meeting Electro-chem Soc. Electrochem. Soc., Washington (1971) 257 |
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metallurgical applications; Atom Probe Field Ion Microscopy |
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6321 |
| Permanent link to this record |
