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Dong, Y.; Etienne, A.; Frolov, A.; Fedotova, S.; Fujii, K.; Fukuya, K.; Hatzoglou, C.; Kuleshova, E.; Lindgren, K.; London, A.; Lopez, A.; Lozano-Perez, S.; Miyahara, Y.; Nagai, Y.; Nishida, K.; Radiguet, B.; Schreiber, D.K.; Soneda, N.; Thuvander, M.; Toyama, T.; Wang, J.; Sefta, F.; Chou, P.; Marquis, E.A. |
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Atom Probe Tomography Interlaboratory Study on Clustering Analysis in Experimental Data Using the Maximum Separation Distance Approach |
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Journal Article |
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2019 |
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Microscopy and Microanalysis |
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25 |
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2 |
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356-366 |
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atom probe tomography; cluster analysis; maximum separation |
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Abbreviated Series Title |
We summarize the findings from an interlaboratory study conducted between ten international research groups and investigate the use of the commonly used maximum separation distance and local concentration thresholding methods for solute clustering quantification. The study objectives are: to bring clarity to the range of applicability of the methods; identify existing and/or needed modifications; and interpretation of past published data. Participants collected experimental data from a proton-irradiated 304 stainless steel and analyzed Cu-rich and Ni-Si rich clusters. The datasets were also analyzed by one researcher to clarify variability originating from different operators. The Cu distribution fulfills the ideal requirements of the maximum separation method (MSM), namely a dilute matrix Cu concentration and concentrated Cu clusters. This enabled a relatively tight distribution of the cluster number density among the participants. By contrast, the group analysis of the Ni-Si rich clusters by the MSM was complicated by a high Ni matrix concentration and by the presence of Si-decorated dislocations, leading to larger variability among researchers. While local concentration filtering could, in principle, tighten the results, the cluster identification step inevitably maintained a high scatter. Recommendations regarding reporting, selection of analysis method, and expected variability when interpreting published data are discussed. |
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Cambridge University Press |
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2019/02/04 |
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1431-9276 |
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NU @ karnesky @ |
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11537 |
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Prosa, T.J.; Strennen, S.; Olson, D.; Lawrence, D.; Larson, D.J. |
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A Study of Parameters Affecting Atom Probe Tomography Specimen Survivability |
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Journal Article |
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2019 |
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Microscopy and Microanalysis |
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25 |
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2 |
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425-437 |
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analysis yield; experimental design; electric field; tensile stress; silicon-based materials |
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Specimen survivability is a primary concern to those who utilize atom probe tomography (APT) for materials analysis. The state-of-the-art in understanding survivability might best be described as common-sense application of basic physics principles to describe failure mechanisms. For example, APT samples are placed under near-failure mechanical-stress conditions, so reduction in the force required to initiate field evaporation must provide for higher survivability--a common sense explanation of survivability. However, the interplay of various analytical conditions (or instrumentation) and how they influence survivability (e.g., decreasing the applied evaporation field improves survivability), and which factors have more impact than others has not been studied. In this paper, we report on the systematic analysis of a material composed of a silicon-dioxide layer surrounded on two sides by silicon. In total, 261 specimens were fabricated and analyzed under a variety of conditions to correlate statistically significant survivability trends with analysis conditions and other specimen characteristics. The primary result suggests that, while applied field/force plays an obvious role in survivability for this material, the applied field alone does not predict survivability trends for silicon/silicon-dioxide interfaces. The rate at which ions are extracted from the specimen (both in terms of ions-per-pulse and pulse-frequency) has similar importance. |
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Cambridge University Press |
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2018/11/05 |
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1431-9276 |
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NU @ karnesky @ |
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11541 |
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Hren, John J. |
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Field-ion microscopy |
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1968 |
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244 |
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APFIM-shortbib |
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Plenum Press |
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NU @ karnesky @ |
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Brenner, S. S. |
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Microchemical analysis of intermetallic alloys using the field-ion microscope atom probe |
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1991 |
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atom probe field ion microscopy |
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DOE/ER/45213-T2
DE92004020, 7 pp. Avail. NTIS from: Energy Res. Abstr. 1992, 17(3), Abstr. No. 6905 (1991) |
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5569 |
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Heck, P. R.; Pellin, M. J.; Davis, A. M.; Martin, I.; Renaud, I.; Benbalagh, R.; Isheim, D.; Seidman, D. N.; Hiller, J.; Stephan, T.; Lewis, R. S.; Savina, M. R.; Maine, A.; Elam, J.; Staermann, F. J.; Zhao, X.; Daulton, T. L.; Amari, S. |
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Atom-Probe Tomographic Analyses of Presolar Silicon Carbide Grains and Meteoric Nanodiamonds – First Results on Silicon Carbide |
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Abstract |
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2010 |
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40th Lunar and Planetary Science Conference |
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NU @ karnesky @ |
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10734 |
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Brenner, S. Sidney |
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FIM/Atom Probe Study of Grain Boundaries in Ni3Al |
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Report |
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NU @ karnesky @ |
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10911 |
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Gorman, B.P.; Guthrey, H.; Norman, A.G.; Al-Jassim, M.; Lawrence, D.; Prosa, T. |
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Atomic Scale Characterization of Compound Semiconductors using Atom Probe Tomography: Preprint |
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Conference Article |
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2011 |
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37th IEEE Photovoltaic Specialists Conference (PVSC 37) |
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Internal interfaces are critical in determining the
performance of III-V multijunction solar cells. Studying
these interfaces with atomic resolution using a
combination of transmission electron microscopy (TEM),
atom probe tomography (APT), and density functional
calculations enables a more fundamental understanding of
carrier dynamics in photovoltaic (PV) device structures.
To achieve full atomic scale spatial and chemical
resolution, data acquisition parameters in laser pulsed
APT must be carefully studied to eliminate surface
diffusion. Atom probe data with minimized group V ion
clustering and expected stoichiometry can be achieved by
adjusting laser pulse power, pulse repetition rate, and
specimen preparation parameters such that heat flow
away from the evaporating surface is maximized.
Applying these improved analysis conditions to III-V based
PV gives an atomic scale understanding of compositional
and dopant profiles across interfaces and tunnel junctions
and the initial stages of alloy clustering and dopant
accumulation. Details on APT experimental methods and
future in-situ instrumentation developments are illustrated. |
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National Renewable Energy Laboratory (NREL), Golden, CO. |
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NU @ karnesky @ gorman2011atomic |
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11145 |
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Audiffren, M.; Traimond, P.; Bardon, J.; Drechsler, M. |
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Study of two-dimensional aggregates of W by field-ion microscopy (French) |
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Book Chapter |
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1977 |
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3rd Coll. Intl. Phys. Chim. Surf Solides, Grenoble |
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401 |
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surface structure; Field Ion Microscopy |
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7152 |
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Gordon, Lyle Matthew; Tran, Lawrence; Joester, Derk |
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Atom Probe Tomography of Apatites and Bone-Type Mineralized Tissues |
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Journal Article |
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2012 |
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ACS Nano |
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ACS Nano |
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Nanocrystalline biological apatites constitute the mineral phase of vertebrate bone and teeth. Beyond their central importance to the mechanical function of our skeleton, their extraordinarily large surface acts as the most important ion exchanger for essential and toxic ions in our body. However, the nanoscale structural and chemical complexity of apatite-based mineralized tissues is a formidable challenge to quantitative imaging. For example, even energy-filtered electron microscopy is not suitable for detection of small quantities of low atomic number elements typical for biological materials. Herein we show that laser-pulsed atom probe tomography, a technique that combines sub-nanometer spatial resolution with unbiased chemical sensitivity, is uniquely suited to the task. Common apatite end members share a number of features, but can clearly be distinguished by their spectrometric fingerprint. This fingerprint and the formation of molecular ions during field evaporation can be explained based on the chemistry of the apatite channel ion. Using end members for reference, we are able to interpret the spectra of bone and dentin samples, and generate the first three-dimensional reconstruction of 1.2·107 atoms in a dentin sample. The fibrous nature of the collagenous organic matrix in dentin is clearly recognizable in the reconstruction. Surprisingly, some fibers show selectivity in binding for sodium ions over magnesium ions, implying that an additional, chemical level of hierarchy is necessary to describe dentin structure. Furthermore, segregation of inorganic ions or small organic molecules to homophase interfaces (grain boundaries) is not apparent. This has implications for the platelet model for apatite biominerals. |
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American Chemical Society |
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1936-0851 |
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doi: 10.1021/nn3049957 |
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NU @ karnesky @ |
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11416 |
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Furuno, Kazuko; Akamatsu, Hiroki; Oh-ishi, Keiichiro; Furukawa, Minoru; Horita, Zenji; Langdon, Terence G. |
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Microstructural development in equal-channel angular pressing using a 60° die |
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Journal Article |
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2004 |
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Acta Materialia |
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Acta Mater. |
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52 |
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2497-2507 |
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Aluminum; Equal-channel angular pressing; Grain boundary misorientations; Texture; Ultrafine-grained microstructures |
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Billets of pure aluminum and an Al–1%Mg–0.2%Sc alloy were successfully processed using equal-channel angular pressing (ECAP) with a die having an internal channel angle of 60°. Careful inspection of the microstructures after ECAP revealed excellent agreement, at both the macroscopic and the microscopic levels, with the theoretical predictions for shearing using a 60° die. The grain sizes introduced with the 60° die were slightly smaller than with a conventional 90° die; thus, the values with these two dies were ~1.1 and ~1.2 small mu, Greekm in pure Al and ~0.30 and ~0.36 small mu, Greekm in the Al–Mg–Sc alloy, respectively. Tensile testing of the pure aluminum at room temperature revealed similar strengthening after processing using either a 60° or a 90° die. In tests conducted at 673 K, the Al–Mg–Sc alloy processed with the 60° die exhibited significantly higher elongations to failure due primarily to the larger strain imposed with this die. It is shown using orientation imaging microscopy that superplastic flow in the Al–Mg–Sc alloy produces an essentially random texture and a distribution of boundary misorientations that approximates to the theoretical distribution for an array of randomly oriented grains. |
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NU @ karnesky @ |
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530 |
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