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Title (up) Kellogg, G. L.; Brenner, S. S.
Year Atomic-level studies of superconducting and nonsuperconducting YBa2Cu3O7-x
Abbreviated Journal Journal Article
Issue 1989 Keywords Applied Physics A: Materials Science & Processing
Address Appl. Phys. A
Thesis A48
Place of Publication Language 197-201
Original Title 123 high Tc superconductor APFIM; Atom Probe Field Ion Microscopy
Series Title Series Volume
Serial Orig Record
no 4723
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Kellogg, G. L.; Brenner, S. S. Atomic-level studies of superconducting YBa2Cu3O7-x Journal Article 1988 Am. Inst. Phys. Conf. Proc. 165 123 high Tc superconductor APFIM no 4105
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Grenier, A.; Larde, R.; Cadel, E.; Vurpillot, F.; Juraszek, J.; Teillet, J.; Tiercelin, N. Atomic-scale study of TbCo[sub 2.5]/Fe multilayers by laser-assisted tomographic atom probe Journal Article 2007 Journal of Applied Physics J. Appl. Phys. 102 3 033912-33914 Sputtered (TbCo2.5 25 nm/Fe 20 nm) multilayers have been analyzed by laser-assisted tomographic atom probe. It allowed us to perform three-dimensional reconstructions of the layers and to determine their composition at the atomic scale. From the concentration profiles inside the multilayer, we show that the diffused interfaces are not symmetric and that a stronger Fe-Co mixing is present at the top of the crystalline iron layers as compared to the top of amorphous TbCo layers. Aip no NU @ karnesky @ 9807
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Nam, A. J.; Teren, A.; Lusby, T. A.; Melmed, A. J. Benign making of sharp tips for STM and FIM: Pt, Ir, Au, Pd, and Rh Journal Article 1995 Journal of Vacuum Science & Technology A J. Vac. Sci. Technol. A 13B 4 1556-1559 Field Ion Microscopy Sharp tips for various modern microscopies, such as field-ion microscopy ~FIM! and scanning tunneling microscopy ~STM!, can be prepared by electropolishing in solutions which are relatively innocuous for the environment as well as the researcher, compared to the often hazardous solutions still in widespread use.We have made measurements of polishing times as a function of solution and voltage parameters and we report conditions for electropolishing sharp tips of Pt, Ir, Au, Pd, and Rh using relatively benign solutions. no 2761
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Nazarenko, V. A. Calculation of the current voltage characteristics of a field ion microscope Journal Article 1970 International Journal of Mass Spectrometry and Ion Physics Int. J. Mass Spectrom. Ion Phys. 5 construction and design; Atom Probe Field Ion Microscopy no 6252
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Miller, M. K.; Beaven, P. A.; Smith, G. D. W.; Brenner, S. S. Carbon distribution during the aging of iron-nickel-carbon martensites Journal Article 1982 Int. Conf. on Solid-Solid Phase Transform., H. I. Aaron, ed., Metall. Soc. AIME, Warrendale, PA (1982) 863-867 martensite ageing C no 8242
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French, R. D.; Richman, M. H. Carburizing tungsten in the field ion microscope Journal Article 1968 Phil. Mag. 18 carburizing; Field Ion Microscopy no 5979
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M. Young, J.D. DeFouw, J. Frenzel, D.C. Dunand Cast Replicated NiTiCu Foams with Shape-Memory Properties Journal Article 2012 Metallurgical and Materials Transactions A 43 8 2939-44 no NU @ michaeljsrawlings @ 11446
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Humphreys, E. S.; Warren, P. J.; Cerezo, A. Characterisation of a rapidly solidified Al-V-Fe alloy Journal Article 1998 Materials Science and Engineering A Mater. Sci. Eng. A A250 158-163 3D Atom Probe, Aluminum alloys This paper outlines preliminary results from a combined XRD: TEM and APFIM investigation of a rapidly solidified Al94V4Fe2 alloy that had been produced by melt spinning. The microstructure produced consists of a high volume fraction (approximate to 50%) of 20 nm icosahedral particles in an f.c.c. matrix. Three-dimensional atom probe analysis shows that this second phase is enriched in iron and vanadium compared with the matrix. The thermal stability of the melt-spun ribbon has been investigated using DSC. It was found to be stable up to a temperature of 520 degrees C, after which there were two solid state transformations. (C) 1998 Elsevier Science S.A. All rights no 2355
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Myers, A. F.; Camphausen, S. M.; Cuomo, J. J.; Hren, J. J.; Liu, J.; Bruley, J. Characterization of amorphous carbon coated silicon field emitters Journal Article 1996 Journal of Vacuum Science & Technology A J. Vac. Sci. Technol. A 14B 2024-2029 Field Emission no 2207
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