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Type Warren, P. J.; Thuvander, M.; Abraham, M.; Lane, H.; Cerezo, A.; Smith, W., G D
  Publication 3-D atom probe studies of some nanostructured materials Volume Journal Article
Pages 2000
  Abstract Materials Science Forum  
  Corporate Author Mater. Sci. Forum  
Publisher 343  
Editor
  Summary Language 701-708 Series Editor  
Abbreviated Series Title
  Series Issue ISSN  
Medium
  Expedition Notes  
Call Number  
Contribution Id  
Serial URL ISBN  
no 9007
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Isheim, Dieter; Kaszpurenko, Jason; Yu, Dong; Mao, Zugang; Seidman, David N.; Arslan, Ilke 3-D Atomic-Scale Mapping of Manganese Dopants in Lead Sulfide Nanowires Journal Article 2012 J. Phys. Chem. C The Journal of Physical Chemistry C 116 11 6595-6600 Dopants in nanowires, whether intentional or unintentional, can ultimately control the material?s properties and, therefore, need to be understood on the atomic scale. We study vapor?liquid?solid grown manganese-doped lead sulfide nanowires by atom-probe tomography for the first time for lead salt materials. The three-dimensional chemical concentration maps at the atomic scale demonstrate a radial distribution profile of Mn ions, with a concentration of only 0.18 and 0.01 at. % for MnCl2 and Mn-acetate precursors, respectively. The ability to characterize these small concentrations of dopant atoms in Pb1?xMnxS nanowires (x = 0.0036 and 0.0002), important for spintronic and thermoelectric devices, sets a platform for similar analyses for all nanostructures. First-principles calculations confirm that Mn atoms substitute for Pb in the PbS structure. American Chemical Society 1932-7447 doi: 10.1021/jp300162t no NU @ karnesky @ 11346
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Miller, M. K.; Brenner, S. S.; eds., 32nd Intl. Field Emission Symposium, Wheeling, W. Va. Journal Article 1986 Journal de Physique J. de Phys. 47-C2 no 3660
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Burke, M. G.; Miller, M. K.; Brenner, S. S.; Soffa, W. A. A combined AEM/FIM study of precipitation in an Fe-25 at. % Be alloy Journal Article 1984 Anal. Electron Microsc., Proc. Workshop, D. B. Williams and D. C. Joy, eds., San Francisco Press, San Francisco, CA (1984) 157-160 APFIM FeBe no 8518
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Burke, M. G.; Sieloff, D. D.; Brenner, S. S. A combined TEM/FIM examination of field emission as a FIM specimen preparation technique Journal Article 1986 Journal de Physique J. de Phys. 47-C7 459-462 FIM specimen preparation field emission TEM; Field Ion Microscopy no 3506
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Leisch, M.; Rendulic, K. D. A combined time-of-flight spectrometer using field desorption and ion impact sputtering Journal Article 1992 Surface Science Surf. Sci. 266 Atom Probe Field Ion Microscopy no 5078
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Rendulic, K. D. A comparison between FIM and LEED studies of surface reconstruction Journal Article 1970 Surface Science Surf. Sci. 21 surface structure; Field Ion Microscopy no 6267
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Everett, K. G.; Walck, S. D.; Schmid, G. M.; Hren, J. J. A field ion microscope - imaging atom probe study of the underpotential deposition of copper on platinum Journal Article 1984 Surface Science Surf. Sci. 145, atom probe field ion microscopy no 8548
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Ren, D. M.; Liu, W.; Hu, B. Y.; Zhou, G. E.; Qin, J. H. A FIM investigation of high temperature superconducting Bi2(Sr, Ca)3Cu2Oy Journal Article 1991 Surface Science Surf. Sci. 246 Field Ion Microscopy no 4465
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Leisch, M.; Rendulic, K. D. A mass-spectrometric investigation of the incorporation of organic matter into electrodeposits Journal Article 1984 Z. Metall Kunde Bd 75, no 8597
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