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Records |
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Warren, P. J.; Thuvander, M.; Abraham, M.; Lane, H.; Cerezo, A.; Smith, W., G D |
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Publication |
3-D atom probe studies of some nanostructured materials |
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Journal Article |
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2000 |
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Abstract |
Materials Science Forum |
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Mater. Sci. Forum |
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343 |
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701-708 |
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9007 |
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Isheim, Dieter; Kaszpurenko, Jason; Yu, Dong; Mao, Zugang; Seidman, David N.; Arslan, Ilke |
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3-D Atomic-Scale Mapping of Manganese Dopants in Lead Sulfide Nanowires |
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Journal Article |
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2012 |
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J. Phys. Chem. C |
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The Journal of Physical Chemistry C |
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116 |
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11 |
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6595-6600 |
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Dopants in nanowires, whether intentional or unintentional, can ultimately control the material?s properties and, therefore, need to be understood on the atomic scale. We study vapor?liquid?solid grown manganese-doped lead sulfide nanowires by atom-probe tomography for the first time for lead salt materials. The three-dimensional chemical concentration maps at the atomic scale demonstrate a radial distribution profile of Mn ions, with a concentration of only 0.18 and 0.01 at. % for MnCl2 and Mn-acetate precursors, respectively. The ability to characterize these small concentrations of dopant atoms in Pb1?xMnxS nanowires (x = 0.0036 and 0.0002), important for spintronic and thermoelectric devices, sets a platform for similar analyses for all nanostructures. First-principles calculations confirm that Mn atoms substitute for Pb in the PbS structure. |
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American Chemical Society |
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1932-7447 |
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doi: 10.1021/jp300162t |
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NU @ karnesky @ |
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11346 |
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Miller, M. K.; Brenner, S. S.; eds., |
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32nd Intl. Field Emission Symposium, Wheeling, W. Va. |
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Journal Article |
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1986 |
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Journal de Physique |
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J. de Phys. |
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47-C2 |
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3660 |
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Burke, M. G.; Miller, M. K.; Brenner, S. S.; Soffa, W. A. |
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A combined AEM/FIM study of precipitation in an Fe-25 at. % Be alloy |
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Journal Article |
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1984 |
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Anal. Electron Microsc., Proc. Workshop, D. B. Williams and D. C. Joy, eds., San Francisco Press, San Francisco, CA (1984) 157-160 |
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APFIM FeBe |
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8518 |
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Burke, M. G.; Sieloff, D. D.; Brenner, S. S. |
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A combined TEM/FIM examination of field emission as a FIM specimen preparation technique |
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Journal Article |
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1986 |
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Journal de Physique |
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J. de Phys. |
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47-C7 |
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459-462 |
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FIM specimen preparation field emission TEM; Field Ion Microscopy |
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3506 |
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Leisch, M.; Rendulic, K. D. |
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A combined time-of-flight spectrometer using field desorption and ion impact sputtering |
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Journal Article |
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1992 |
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Surface Science |
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Surf. Sci. |
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266 |
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Atom Probe Field Ion Microscopy |
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5078 |
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Rendulic, K. D. |
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A comparison between FIM and LEED studies of surface reconstruction |
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Journal Article |
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1970 |
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Surface Science |
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Surf. Sci. |
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21 |
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surface structure; Field Ion Microscopy |
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6267 |
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Everett, K. G.; Walck, S. D.; Schmid, G. M.; Hren, J. J. |
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A field ion microscope - imaging atom probe study of the underpotential deposition of copper on platinum |
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Journal Article |
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1984 |
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Surface Science |
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Surf. Sci. |
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145, |
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atom probe field ion microscopy |
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8548 |
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Ren, D. M.; Liu, W.; Hu, B. Y.; Zhou, G. E.; Qin, J. H. |
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A FIM investigation of high temperature superconducting Bi2(Sr, Ca)3Cu2Oy |
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Journal Article |
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1991 |
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Surface Science |
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Surf. Sci. |
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246 |
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Field Ion Microscopy |
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4465 |
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Leisch, M.; Rendulic, K. D. |
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A mass-spectrometric investigation of the incorporation of organic matter into electrodeposits |
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Journal Article |
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1984 |
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Z. Metall Kunde Bd |
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75, |
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8597 |
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