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Type Greneche, J. M.; Slawska-Waniewska, A.
  Publication About the interfacial zone in nanocrystalline alloys Volume Journal Article
Pages 2000
  Abstract Journal of Magnetism and Magnetic Materials  
  Corporate Author J, Magn. Magn. Mater.  
Publisher 215-216  
Editor
  Summary Language 264-267 Series Editor  
Abbreviated Series Title
  Series Issue ISSN  
Medium
  Expedition Notes  
Call Number  
Contribution Id  
Serial URL ISBN  
no 9003
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Florencio, J.; Ren, D. M.; Tsong, T. T. Absolute composition depth-profiles in surface segregation of Pt-Rh alloys Journal Article 1996 Surface Science Surf. Sci. 345 L29-L33 no 2310
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Münger, E. P.; Chirita, V.; Greene, J. E.; Sundgren, J. - E. Adatom-induced diffusion of two-dimensional close-packed Pt7 clusters on Pt(111) Journal Article 1996 Surface Science Surf. Sci. 355 L325-L330 no 2302
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Charkabortty, S.; Grenga, H. E. Adsorption of carbon monoxide on ruthenium Journal Article 1973 Journal of Applied Physics J. Appl. Phys. 44 gas surface interactions; Field Ion Microscopy no 6570
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Clifton, P. H.; Larson, D. J.; Gordon, L. M.; Joester, D.; Inoue, K.; Reinhard, D. A.; Prosa, T. J.; Ulfig, R. M.; Lawrence, D.; Kelly, T. F. Advances in Atom Probe Tomography Applications Abstract 2012 The 15th European Microscopy Congress Atom probe tomography (APT) has been used for over 45 years, “to determine the composition of small volumes of metals, semiconductors, and some ceramics” [1]. Although this statement is still true some 12 years after it was written, it does not adequately capture the recent expansion and maturation of APT into non-metallurgical applications. Historically, the low analysis success rate in non-metallurgical applications has limited the utility of the technique for such materials. However, recent innovations have been shown to provide substantially higher analysis yield on a wide variety of materials [2] enabling a range of meaningful new applications for APT such as quantum wells (QWs) and transistors. Defects are known to have a significant effect on properties of InGaN multi-quantum-well devices [3]. The availability of low-pulse-energy laser pulsing has allowed for high-quality and low-noise imaging of a V defect centered above a threading dislocation (Fig. 1). This dislocation may change the electrical properties of the QWs due to the resultant segregation of magnesium dopants. Characterization of complicated microelectronic structures, such as transistors, which contain a variety of materials and interfaces, has been severely limited because of analysis yield limitations. The recent introduction of UV laser pulsing, together with a highly focused, diffraction limited, laser spot, has provided improved yield allowing for regular analysis of real devices such as the n- and p- MOS transistors as shown in Fig. 2. Applications also exist in the area of organic materials. In the chiton tooth, a polysaccharide-rich scaffold containing a number of proteins templates the formation of ultra-hard nano-crystalline iron oxide (magnetite). The nanoscale interfaces between the mineral phase and the buried organic scaffold are shown in Fig. 3, providing insight into the formation processes and the properties of the composite [4]. In addition to the above, several selected examples of APT applications advances will be presented in the current work, including light emitting diodes [5], microelectronics [6,7], solar cells [8,9], geology [11], and cosmology [10]. [1] MK Miller, Atom Probe Tomography: Analysis at the Atomic Level, Kluwer Academic /Plenum Publishers (2000) p.2. [2] RM Ulfig et al, Microscopy and Microanalysis 17(S2) (2011) p. 714. [3] CJ Humphreys et al, Springer Proc. Physics 120 (2007) p. 3. [4] LM Gordon and D. Joester, Nature 469 (2012) p. 194. [5] TJ Prosa et al, Applied Physics Letters 98 (2011) p. 191903. [6] DJ Larson et al, Inst. Phys. Conf. Series 326 (2011) p. 012030. [7] H Takamizawa et al, Applied Physics Letters, 99 (2011) p. 133502 [8] PP Choi et al, Microscopy Today (2012) in press. [9] DJ Larson et al, Microscopy & Microanalysis (2012), submitted. [10] D Snoeyenbos et al, 22nd Goldschmid Conference on Geochemistry (2012), submitted. [11] P Heck et al, 43rd Lunar and Planetary Science Conference (2012), submitted. no NU @ karnesky @ 11389
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Chang, L.; Cerezo, A.; Smith, G. D. W.; Miller, M. K.; Burke, M. G.; Brenner, S. S.; Taylor, K. A.; Abe, T.; Olson, G. B. Aging of Fe-Ni-C martensite Journal Article 1984 Journal de Physique J. de Phys. 45-C9 martensite FeNiC Aging APFIM no 8523
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Hren, J. J. An analysis of the atomic configuration of an incoherent twin boundary with the FIM Journal Article 1965 Acta Met 13 twin; Field Ion Microscopy no 5791
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Sha, Gang; Ringer, Simon P.; Duan, Zhi Chao; Langdon, Terence G. An atom probe characterisation of grain boundaries in an aluminium alloy processed by equal-channel angular pressing Journal Article 2009 International Journal of Materials Research 2009 12 1674-1678 The segregation of solute elements at the grain boundaries of an Al–Zn–Mg–Cu alloy processed by equal-channel angular pressing was characterised using three-dimensional atom probe tomography. The results show that Mg and Cu segregate strongly to the grain boundaries but Zn shows no clear segregation and even becomes depleted near the boundaries. Trace elements such as Zr, Cr, Si and Mn show no clear segregation at the grain boundaries. An increase in the number of passes leads to a decrease in the grain size but there is no clear effect on the levels of solute segregation at the boundaries. The significant segregation of certain major alloying element at the boundaries of ultrafine-grained alloys implies that the less super-saturation solutes in the matrix will be available for precipitation with a decrease in the average grain size. no NU @ karnesky @ 10772
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Vaumousse, D.; Cerezo, A.; Warren, P. J.; Court, S. A. An atom probe study of fine scale structure in AlMgSi(Cu) alloys Journal Article 2002 Materials Science Forum Mater. Sci. Forum 396-4 693-698 no 9180
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Brenner, S. S.; Miller, M. K.; Soffa, W. A. An atom probe study of precipitation in iron-chromium alloys at low temperatures Book Chapter 1982 Proceedings of an International Conference on Solid - Solid Phase Transformations: Proceedings of the International Conference on Solid-To-Solid Phase Transformations in Inorganic Materials Ptm9 Proc. Intl. Conf. Solid-Solid Phase Transform. spinodal decomposition FeCr APFIM; atom probe field ion microscopy TMS Warrendale, PA Johnson, W. C.; Howe, J. M.; Laughlin, D. E.; Soffa, W. A. 0873392787 no 8871
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