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Kellogg, G. L.; Brenner, S. S. |
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Atomic-level studies of superconducting and nonsuperconducting YBa2Cu3O7-x |
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Journal Article |
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1989 |
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Abstract |
Applied Physics A: Materials Science & Processing |
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Appl. Phys. A |
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A48 |
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Summary Language |
197-201 |
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123 high Tc superconductor APFIM; Atom Probe Field Ion Microscopy |
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4723 |
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Kellogg, G. L.; Brenner, S. S. |
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Atomic-level studies of superconducting YBa2Cu3O7-x |
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Journal Article |
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1988 |
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Am. Inst. Phys. Conf. Proc. |
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165 |
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123 high Tc superconductor APFIM |
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4105 |
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Grenier, A.; Larde, R.; Cadel, E.; Vurpillot, F.; Juraszek, J.; Teillet, J.; Tiercelin, N. |
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Atomic-scale study of TbCo[sub 2.5]/Fe multilayers by laser-assisted tomographic atom probe |
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Journal Article |
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2007 |
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Journal of Applied Physics |
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J. Appl. Phys. |
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102 |
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3 |
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033912-33914 |
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Sputtered (TbCo2.5 25 nm/Fe 20 nm) multilayers have been analyzed by laser-assisted tomographic atom probe. It allowed us to perform three-dimensional reconstructions of the layers and to determine their composition at the atomic scale. From the concentration profiles inside the multilayer, we show that the diffused interfaces are not symmetric and that a stronger Fe-Co mixing is present at the top of the crystalline iron layers as compared to the top of amorphous TbCo layers. |
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Aip |
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NU @ karnesky @ |
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9807 |
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Nam, A. J.; Teren, A.; Lusby, T. A.; Melmed, A. J. |
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Benign making of sharp tips for STM and FIM: Pt, Ir, Au, Pd, and Rh |
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Journal Article |
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1995 |
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Journal of Vacuum Science & Technology A |
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J. Vac. Sci. Technol. A |
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13B |
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4 |
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1556-1559 |
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Field Ion Microscopy |
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Sharp tips for various modern microscopies, such as field-ion microscopy ~FIM! and scanning
tunneling microscopy ~STM!, can be prepared by electropolishing in solutions which are relatively
innocuous for the environment as well as the researcher, compared to the often hazardous solutions
still in widespread use.We have made measurements of polishing times as a function of solution and
voltage parameters and we report conditions for electropolishing sharp tips of Pt, Ir, Au, Pd, and Rh
using relatively benign solutions. |
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2761 |
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Nazarenko, V. A. |
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Calculation of the current voltage characteristics of a field ion microscope |
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Journal Article |
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1970 |
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International Journal of Mass Spectrometry and Ion Physics |
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Int. J. Mass Spectrom. Ion Phys. |
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5 |
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construction and design; Atom Probe Field Ion Microscopy |
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6252 |
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Miller, M. K.; Beaven, P. A.; Smith, G. D. W.; Brenner, S. S. |
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Carbon distribution during the aging of iron-nickel-carbon martensites |
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Journal Article |
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1982 |
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Int. Conf. on Solid-Solid Phase Transform., H. I. Aaron, ed., Metall. Soc. AIME, Warrendale, PA (1982) 863-867 |
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martensite ageing C |
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8242 |
| Permanent link to this record |
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French, R. D.; Richman, M. H. |
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Carburizing tungsten in the field ion microscope |
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Journal Article |
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1968 |
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Phil. Mag. |
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18 |
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carburizing; Field Ion Microscopy |
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5979 |
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M. Young, J.D. DeFouw, J. Frenzel, D.C. Dunand |
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Cast Replicated NiTiCu Foams with Shape-Memory Properties |
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Journal Article |
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2012 |
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Metallurgical and Materials Transactions A |
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43 |
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8 |
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2939-44 |
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NU @ michaeljsrawlings @ |
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11446 |
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Humphreys, E. S.; Warren, P. J.; Cerezo, A. |
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Characterisation of a rapidly solidified Al-V-Fe alloy |
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Journal Article |
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1998 |
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Materials Science and Engineering A |
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Mater. Sci. Eng. A |
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A250 |
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158-163 |
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3D Atom Probe, Aluminum alloys |
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This paper outlines preliminary results from a combined XRD: TEM and APFIM investigation of a rapidly solidified Al94V4Fe2 alloy that had been produced by melt spinning. The microstructure produced consists of a high volume fraction (approximate to 50%) of 20 nm icosahedral particles in an f.c.c. matrix. Three-dimensional atom probe analysis shows that this second phase is enriched in iron and vanadium compared with the matrix. The thermal stability of the melt-spun ribbon has been investigated using DSC. It was found to be stable up to a temperature of 520 degrees C, after which there were two solid state transformations. (C) 1998 Elsevier Science S.A. All rights |
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2355 |
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Myers, A. F.; Camphausen, S. M.; Cuomo, J. J.; Hren, J. J.; Liu, J.; Bruley, J. |
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Characterization of amorphous carbon coated silicon field emitters |
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Journal Article |
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1996 |
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Journal of Vacuum Science & Technology A |
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J. Vac. Sci. Technol. A |
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14B |
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2024-2029 |
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Field Emission |
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no |
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2207 |
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