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Piller, J.; Miller, M. K.; Brenner, S. S. |
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Nucleation and coarsening behaviour of TiC precipitates in alpha-Fe and the effects of antimony additions |
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Book Chapter |
Pages |
1982 |
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Abstract |
Proc. 29th IFES, Gothenburg |
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Summary Language |
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TiC nucleation coarsening Sb Fe |
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Almqvist and Wiksell |
Notes |
Stockholm |
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Call Number |
Andren, H.-O.; Norden, H. |
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8267 |
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Soffa, W. A.; Brenner, S. S.; Camus, P. P.; Miller, M. K. |
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Atom-probe studies of precipitation in iron-chromium-cobalt alloys |
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Book Chapter |
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1982 |
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Proc. 29th IFES, Gothenburg |
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FeCrCo Chromindur APFIM |
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Almqvist and Wiksell |
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Stockholm |
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Andren, H.-O.; Norden, H. |
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8288 |
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Soffa, W. A.; Brenner, S. S.; Miller, M. K. |
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Atom probe studies of the decomposition spectrum in alloys |
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Book Chapter |
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1984 |
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Decomposition of Alloys: The Early Stages |
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227-232 |
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FeCr spinodal decomposition APFIM; atom probe field ion microscopy |
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Pergamon |
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Oxford |
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Haasen, P.; Gerold, V.; Wagner, R.; Ashby, M. F. |
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Acta-Scripta Metallurgica Proceedings |
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2 |
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0080316514 |
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8662 |
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Brenner, S. S.; Miller, M. K.; Soffa, W. A. |
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An atom probe study of precipitation in iron-chromium alloys at low temperatures |
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Book Chapter |
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1982 |
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Proceedings of an International Conference on Solid - Solid Phase Transformations: Proceedings of the International Conference on Solid-To-Solid Phase Transformations in Inorganic Materials Ptm9 |
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Proc. Intl. Conf. Solid-Solid Phase Transform. |
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spinodal decomposition FeCr APFIM; atom probe field ion microscopy |
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TMS |
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Warrendale, PA |
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Johnson, W. C.; Howe, J. M.; Laughlin, D. E.; Soffa, W. A. |
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0873392787 |
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8871 |
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Larson, David J.;Prosa, Ty J.; Lawrence, Dan;Geiser, Brian P.; Jones, Clive M.; Kelly, Thomas F. |
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Atom Probe Tomography for Microelectronics |
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Book Chapter |
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2012 |
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Chapter 10 in: Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization |
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1 |
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407-477 |
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Mircoelectronics; Semiconductors; Handbook |
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World Scientific Publishing |
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Singapore |
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R. Haight, F. Ross, J. Hannon |
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NU @ pbocchin @ |
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11308 |
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Hren, John J. |
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Field-ion microscopy |
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Book Whole |
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1968 |
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244 |
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APFIM-shortbib |
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Plenum Press |
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NU @ karnesky @ |
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399 |
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Gorman, B.P.; Guthrey, H.; Norman, A.G.; Al-Jassim, M.; Lawrence, D.; Prosa, T. |
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Atomic Scale Characterization of Compound Semiconductors using Atom Probe Tomography: Preprint |
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Conference Article |
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2011 |
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37th IEEE Photovoltaic Specialists Conference (PVSC 37) |
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Internal interfaces are critical in determining the
performance of III-V multijunction solar cells. Studying
these interfaces with atomic resolution using a
combination of transmission electron microscopy (TEM),
atom probe tomography (APT), and density functional
calculations enables a more fundamental understanding of
carrier dynamics in photovoltaic (PV) device structures.
To achieve full atomic scale spatial and chemical
resolution, data acquisition parameters in laser pulsed
APT must be carefully studied to eliminate surface
diffusion. Atom probe data with minimized group V ion
clustering and expected stoichiometry can be achieved by
adjusting laser pulse power, pulse repetition rate, and
specimen preparation parameters such that heat flow
away from the evaporating surface is maximized.
Applying these improved analysis conditions to III-V based
PV gives an atomic scale understanding of compositional
and dopant profiles across interfaces and tunnel junctions
and the initial stages of alloy clustering and dopant
accumulation. Details on APT experimental methods and
future in-situ instrumentation developments are illustrated. |
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National Renewable Energy Laboratory (NREL), Golden, CO. |
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NU @ karnesky @ gorman2011atomic |
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11145 |
| Permanent link to this record |
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Macrander, Albert T.; Yamamoto, Masahiko; Seidman, David N.; Brenner, S. S. |
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Statistics of the atom-by-atom dissection of planes in an atom-probe field-ion microscope: The number of atoms detected per plane |
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Journal Article |
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1983 |
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Review of Scientific Instruments |
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Rev. Sci. Instrum. |
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54 |
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9 |
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1077-1084 |
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DNS-quantitative |
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The statistics of the atom-by-atom dissection of planes, in the atom-probe field-ion microscope, have been investigated. Tungsten specimens oriented in the [110] direction, with the probe hole over the center of the plane, were slowly pulsed field-evaporated on a plane-by-plane basis, and statistical analyses were made on the number of tungsten atoms detected per plane; 30 separate slow dissection experiments were performed. Observed fluctuations in the number of atoms per plane are used to infer a range of allowable values for the detection efficiency. We find that, in some cases, the number of atoms per plane can be described as following a binomial distribution. From these results detection efficiencies in the range 0.11 to 0.54 were inferred. This range of efficiencies can be understood with the aid of field-ion desorption images. In addition, a value for the detection efficiency of 0.2 was obtained under the assumption that all atoms in the area projected by the probe hole, along the specimen radius, were analyzed. Thus, we find that this geometrical procedure, a first-order approach to the problem, yields a reasonable result. Also, the results of a Monte Carlo simulation of atom-by-atom field evaporation of a large number of planes are presented. The Monte Carlo simulation shows that if a binomial distribution is obtained, the uncertainty in concentrations determined by the atom-probe technique will have only a small component owing to the uncertainty in the number of solvent specimen atomsthis is subject to the caveat that there are no special problems with the field-evaporation behavior of the solvent atoms. Although the statistical analyses were applied to a specific crystallographic plane and position, the methodology is reasonably general and can be applied to other situations. |
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NU @ karnesky @ |
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36 |
| Permanent link to this record |
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Vaumousse, D.; Cerezo, A.; Warren, P. J. |
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A procedure for quantification of precipitate microstructures from three-dimensional atom probe data |
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Journal Article |
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2003 |
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Ultramicroscopy |
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95 |
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215-221 |
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Precipitate quantification; Analytical software method; 3-D atom probe data |
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New analysis software for selecting and quantifying particles in three-dimensional atom maps has been designed. The selection of solute-rich regions is performed by connecting solute atoms which lie within a fixed distance (d), and taking clusters above a certain minimum number of solute atoms (Nmin). Other atoms within some distance L greater than d are taken to belong to the cluster. However, this results in the inclusion of a shell of matrix atoms, which must be removed through an erosion step, to define the final cluster. Data filtered in this way can be used for subsequent quantification of parameters such as size, shape, composition, number density and volume fraction with better accuracy than by manual selection. The choice of d, Nmin and L values is discussed and some methods of evaluation of these parameters are proposed. Examples are presented on the application of this new software to the analysis of early stage clustering in an Al–Mg–Si–Cu alloy and a copper-containing steel. |
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NU @ karnesky @ |
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96 |
| Permanent link to this record |
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Nie, Zuo-ren; Jin, Tou-nan; Zou, Jing-xia; Fu, Jing-bo; Yang, Jin-jun; Zuo, Tie-yong |
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Development on research of advanced rare-earth aluminum alloy |
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Journal Article |
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2003 |
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Transactions of Nonferrous Metals Society of China |
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13 |
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3 |
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509-514 |
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aluminum alloy; rare earth; erbium; scandium; misch metal; Al3Er , SC ALLOY |
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The active mechanisms of rare earth element erbium (Er) in part of aluminum alloys were investigated. Based on the investigation of the effect of the unitary rare earth elements (Er, La, Y, Ce, Nd, Gd, and Sc) and the transition element zirconium on the aluminum alloys, it is concluded that, with Er alloyed, high purity aluminum and Al-Mg alloys are featured with refined grain structure, superior heat stability and even higher hardness or tensile strength with unchanged ductility; but Er is not beneficial to the mechanical property of Al-Cu alloy, so is Sc. It may also be concluded, to most of the aluminum alloys, Er can be an effective alloying element, like Sc; and for the lower price of Er, the cost of modifying aluminum alloys by Er will be reduced. |
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NU @ karnesky @ |
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186 |
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