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Type D J Larson and D Lawrence and W Lefebvre and D Olson and T J Prosa and D A Reinhard and R M Ulfig and P H Clifton and J H Bunton and D Lenz and J D Olson and L Renaud and I Martin and T F Kelly
  Publication Toward atom probe tomography of microelectronic devices Volume (down) Journal Article
Pages 2011
  Abstract Journal of Physics: Conference Series  
  Corporate Author  
Publisher 326  
Editor 1
  Summary Language 012030 Series Editor  
Abbreviated Series Title Atom probe tomography and scanning transmission electron microscopy has been used to analyze a commercial microelectronics device prepared by depackaging and focused ion beam milling. Chemical and morphological data are presented from the source, drain and channel regions, and part of the gate oxide region of an Intel ® i5-650 p-FET device demonstrating feasibility in using these techniques to investigate commercial chips.
  Series Issue ISSN  
Medium
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Serial URL ISBN  
1742-6596 no NU @ karnesky @ 11288
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Han, Bing Q.; Langdon, Terence G. Factors contributing to creep strengthening in discontinuously-reinforced materials Journal Article 2002 Materials Science and Engineering A Mater. Sci. Eng. A 322 1-2 73-78 Composites; Creep; Load transfer; Substructure strengthening; Threshold stress There have been several experimental investigations of the creep behavior of materials with discontinuous reinforcement. For these materials, logarithmic plots of the steady-state or minimum strain rate against the applied stress usually reveal significant curvature such that the stress exponent, determined from the slope of the line, increases with decreasing stress. Plots of this nature are usually interpreted by invoking a threshold stress, o and replacing the applied stress, , with an effective stress, defined as (−o). This paper examines the implications of this approach using published creep data for several aluminum-based materials. It is shown that the introduction of an effective stress leads to a stress exponent that is similar to that observed in the unreinforced matrix material but, nevertheless, the creep rates in the reinforced materials are often significantly slower than in the matrix. This difference is examined with reference to the occurrence of load transfer and substructure strengthening. no NU @ karnesky @ 541
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Böttger, A.; Warren, P. J.; Smith, W., G D; van Genderen, M. J.; Sijbrandij, S. J.; Mittemeijer, E. J. Tempering of iron-carbon-nitrogen martensites: (re)distribution of interstitial atoms Journal Article 1999 Materials Science Forum Mater. Sci. Forum 318-3 103-108 no 8967
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Hattestrand, M.; Andren, H. O. Microstructural development during ageing of an 11% chromium steel alloyed with copper Journal Article 2001 Materials Science and Engineering A Mater. Sci. Eng. A A318 94-101 no 9116
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Grenier, A.; Larde, R.; Cadel, E.; Le Breton, J.M.; Juraszek, J.; Vurpillot, F.; Tiercelin, N.; Pernod, P.; Teillet, J. Structural investigation of TbCo2/Fe magnetostrictive thin films by tomographic atom probe and Mossbauer spectrometry Journal Article 2007 Journal of Magnetism and Magnetic Materials Proceedings of the 17th International Conference on Magnetism, The International Conference on Magne 310 2, Part 3 2215-2216 Magnetostrictive multilayer; Tb-Co-Fe; Tomographic atom probe; Mossbauer spectrometry Sputtered TbCo2/Fe magnetostrictive multilayers have been deposited on both island posts and flat substrates and analysed by laser-assisted tomographic atom probe and 57Fe Mossbauer spectrometry. The three-dimensional reconstructions of the layers were obtained, allowing the analysis of the interfaces. Differences are revealed, as the Fe-on-TbCo2 interface is thinner than the TbCo2-on-Fe interface. This effect is attributed to Fe/Co interdiffusion, controlled by the establishment of the Tb layer. Fe layers are well crystallized. no NU @ m-krug @ 9974
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Lorenzoni, A.; Roman, H. E.; Alasia, F.; Broglia, R. A. High-current field emission from an atomic quantum wire Journal Article 1997 Chem. Phys. Lett. 276 237-241 Field Emission no 2565
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Humphreys, E. S.; Warren, P. J.; Cerezo, A.; Smith, W., G D Microstructural and chemical analysis of nanoscale particles in rapidly solidified Al-V-Fe Journal Article 1999 Materials Science and Engineering A Mater. Sci. Eng. A A270 48-54 3D Atom Probe, Aluminum alloys no 2397
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Stiller, K.; Warren, P. J.; Hansen, V.; Angenete, J.; Gjonnes, J. Investigation of precipitation in an Al-Zn-Mg alloy after two step ageing treatment at 100°C and 150°C Journal Article 1999 Materials Science and Engineering A Mater. Sci. Eng. A A270 55-63 3D Atom Probe, Aluminum alloys no 2426
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Juraszek, J.; Grenier, A.; Teillet, J.; Cadel, E.; Tiercelin, N.; Monnet, I.; Toulemonde, M. Atom probe tomography of swift ion irradiated multilayers Journal Article 2009 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 267 6 912-916 Ion beam mixing; atom probe tomography; multilayers; swift ion irradiation Nanometer scale layered systems are well suited to investigate atomic transport processes induced by high-energy electronic excitations in materials, through the characterization of the interface transformation. In this study, we used the atom probe technique to determine the distribution of the different elements in a (amorphous-Fe2Tb 5 nm/hcp-Co 3 nm)20 multilayer before and after irradiation with Pb ions in the electronic stopping power regime. Atom probe tomography is based on reconstruction of a small volume of a sharp tip evaporated by field effect. It has unique capabilities to characterize internal interfaces and layer chemistry with sub-nanometer scale resolution in three dimensions. Depth composition profiles and 3D element mapping have been determined, evidencing for asymmetric interfaces in the as-deposited sample, and very efficient Fe-Co intermixing after irradiation at the fluence 7×1012 ion cm-2. Estimation of effective atomic diffusion coefficients after irradiation suggests that mixing results from interdiffusion in a molten track across the interface in agreement with the thermal spike model. 0168-583x no NU @ karnesky @ 10581
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Barengolts, S. A.; Kreindel, Y., M; Litvinov, E. A. Nonequilibrium effects in high current field emission Journal Article 1992 Surface Science Surf. Sci. 266 1-3 126-131 Field Emission The effect of the temperature gradients and the electric field existing in the bulk of a metallic cathode on its field emission characteristics has been analyzed. It has been established that, at high emission current densities, the nonequilibrium additive to the electron distribution function increases the fraction of electron emitted with energies close to the Fermi level, as compared to the equilibrium case. Therefore, the form of the energy distribution of the emitted electrons changes and the energy flux through the emission boundary increases. no 4969
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