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Records |
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Rendulic, K. D. |
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Publication |
Corrosive surface reaction in the field ion microscope |
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Journal Article |
Pages |
1968 |
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Abstract |
Surface Science |
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Corporate Author |
Surf. Sci. |
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12 |
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Summary Language |
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Series Editor |
corrosion; Field Ion Microscopy |
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6029 |
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Sanwald, R. C.; Hren, J. J. |
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Interpretation of defects in field ion images: FCC materials |
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Journal Article |
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1968 |
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Surface Science |
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Surf. Sci. |
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9 |
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general crystal defects; Field Ion Microscopy |
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6033 |
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Breyer, J. P.; Leroy, V.; Habraren, L. |
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The field ion microscope |
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Journal Article |
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1969 |
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C N R M |
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21 |
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review; Field Ion Microscopy |
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6074 |
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Fonash, S. J.; Schrenck, G. L. |
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Fermi surface structure and field ionisation |
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Journal Article |
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1969 |
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Physical Review |
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Phys. Rev. |
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180 |
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field ionisation theory and processes; Field Ionization |
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6082 |
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Graham, W. R.; Hutchinson, F.; Nadakavuikaren, J. I.; Reed, D. A.; Schwenterly, S. W. |
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Epitaxial deposition of platinum on iridium at low temperatures |
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Journal Article |
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1969 |
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Journal of Applied Physics |
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J. Appl. Phys. |
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40 |
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epitaxial growth; Field Ion Microscopy |
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6089 |
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Grenga, H.; Hochman, R. |
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Gas-metal interactions field ion and field emission microscopy |
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Book Chapter |
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1969 |
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Appl. of Field Ion Microsc. in Physical Metallurgy and Corrosion |
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391 |
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gas surface interactions; Field Ion Microscopy |
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Georgia Tech Press |
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Atlanta, GA |
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Hochman, R. F.; et al. |
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6090 |
| Permanent link to this record |
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Hren, J. J. |
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Analysis of dislocations and stacking faults by FIM |
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Book Chapter |
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1969 |
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Appl. of Field Ion Microsc. in Physical Metallurgy and Corrosion |
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87 |
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dislocations and slip; Field Ion Microscopy |
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Georgia Tech Press |
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Atlanta, GA |
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Hochman, R. F.; et al. |
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6096 |
| Permanent link to this record |
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Rendulic, K. |
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Corrosion of field ion microscope specimens |
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Book Chapter |
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1969 |
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Appl. of Field Ion Microsc. in Physical Metallurgy and Corrosion |
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413 |
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corrosion; Field Ion Microscopy |
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Georgia Tech Press |
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Atlanta, GA |
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Hochman, R. F.; et al. |
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6147 |
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Brenner, S. S.; Mckinney, J. T. |
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FIM atom probe analysis of individual image spots caused by gas adsorption |
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Journal Article |
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1970 |
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Surface Science |
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Surf. Sci. |
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20 |
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surface reactions; atom probe field ion microscopy |
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6199 |
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Brenner, S. S.; Mckinney, J. T. |
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Construction and performance of an FIM atom probe |
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Journal Article |
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1970 |
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Surface Science |
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Surf. Sci. |
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23 |
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construction and design; atom probe field ion microscopy; APFIM-shortbib-SS23 |
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no |
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6200 |
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