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Type Goldenfeld, I. V.; Nazarenko, V. A.
  Publication Current-voltage characteristics and angular distribution of the ions in field ionisation Volume Journal Article
Pages 1970
  Abstract International Journal of Mass Spectrometry and Ion Physics  
  Corporate Author Int. J. Mass Spectrom. Ion Phys.  
Publisher 5  
Editor
  Summary Language Series Editor current-voltage characteristics; Field Ionization  
Abbreviated Series Title
  Series Issue ISSN  
Medium
  Expedition Notes  
Call Number  
Contribution Id  
Serial URL ISBN  
no 6222
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Jenkins, D. A.; Hren, J. J. Metal tip for field ion microscope Journal Article 1970 Review of Scientific Instruments Rev. Sci. Instrum. 41 current-voltage characteristics; Field Ionization no 6229
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Nazarenko, V. A. Calculation of the current voltage characteristics of a field ion microscope Journal Article 1970 International Journal of Mass Spectrometry and Ion Physics Int. J. Mass Spectrom. Ion Phys. 5 construction and design; Atom Probe Field Ion Microscopy no 6252
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Rendulic, K. D. A comparison between FIM and LEED studies of surface reconstruction Journal Article 1970 Surface Science Surf. Sci. 21 surface structure; Field Ion Microscopy no 6267
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Rendulic, K. D.; Müller, E. W. Optical transformation of field ion micrographs Journal Article 1970 Review of Scientific Instruments Rev. Sci. Instrum. 41 image projection; Field Ion Microscopy no 6268
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Sharma, S. P.; Fonash, S. J.; Schrenk, G. L. The electron transfer process in field ionisation Journal Article 1970 Surface Science Surf. Sci. 23 field ionisation theory and processes; Field Ionization; APFIM-shortbib-SS23 no 6275
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Sharma, S. P.; Schrenk, G. L. Effect of periodic surface potential variation on high field tunneling in field ionisation process Journal Article 1970 Phys Rev B 2 field ionisation theory and processes; Field Ionization no 6276
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Son, U. T.; Hren, J. J. Field ion microscopy of Frank loops in platinum: Computer simulation and experimental observation Journal Article 1970 Phil. Mag. 22 dislocations and slip; Field Ion Microscopy no 6280
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Son, U. T.; Hren, J. J. Measurement of atomic order with the FIM Journal Article 1970 Surface Science Surf. Sci. 23 alloys - short and long range order; Field Ion Microscopy; APFIM-shortbib-SS23 no 6281
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Brenner, S. S.; Goodman, S. R. FIM-atom probe analysis of thin nitride platelets in Fe-3 at per cent Mo Journal Article 1971 Scripta Met 5 metallurgical applications; Atom Probe Field Ion Microscopy no 6320
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