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Type Geiser, B.P.; Kelly, T.F.; Larson, D.J.; Schneir, J.; Roberts, J.P.
  Publication Spatial Distribution Maps for Atom Probe Tomography Volume Journal Article
Pages 2007
  Abstract Microscopy and Microanalysis  
  Corporate Author  
Publisher 13  
Editor 06
  Summary Language 437-447 Series Editor atom probe tomography (APT), spatial distribution maps (SDM), Fourier analysis, spatial resolution, trajectory aberration, crystal structure  
Abbreviated Series Title A real-space technique for finding structural information in atom probe tomographs, spatial distribution maps (SDM), is described. The mechanics of the technique are explained, and it is then applied to some test cases. Many applications of SDM in atom probe tomography are illustrated with examples including finding crystal lattices, correcting lattice strains in reconstructed images, quantifying trajectory aberrations, quantifying spatial resolution, quantifying chemical ordering, dark-field imaging, determining orientation relationships, extracting radial distribution functions, and measuring ion detection efficiency.
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no NU @ karnesky @ 10106
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