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Thevuthasan, S.; Kuchibhatla, Satyanarayana, V. N. T.; Adusumilli, P.; Olszta, M.; Arey, B.; Shutthanandan, V.; McKinely, J. P.; Wang, C. M.; Bruemmer, S.; Baer, D. R.; Prosa, T.; Ulfig, R.; Seidman, D.; Buxbaum, A.; Wang, Y. C.; Tessner, T. |
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Laser Assisted Atom Probe Tomography analysis of nanoscale, energy and environment related materials at EMSL |
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2010 |
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Microscopy and Microanalysis |
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Increasing emphasis on materials with enhanced properties in various functional applications has
provided an impetus to develop the tools that will help understand materials with increased
spatial resolution, at larger field-of-view and enhanced sensitivity. Laser assisted atom probe
tomography analysis fits these objectives well and provides 3D-chemical images. While the atom
probe analysis has been used for a few decades, the development of laser pulsing has extended
the scope of this technique from metals to semiconductors and very recently to the insulating
materials such as bulk oxides. EMSL, a national scientific user facility of the DOE, is developing
an atom probe tomography capability complimenting the existing surface and interfacial
analysis, microscopy capabilities to provide solutions to various problems of interest to energy
and environment, in particular, at the nanoscale.
This presentation examines the feasibility of using atom probe for various challenging materials
systems including some that have not been previously examined by atom probe methods. We
report the first Local Electrode Atom Probe (LEAP®) analysis of Au nanoparticles embedded in
MgO using ion beam synthesis method, in which, 2MeVAu ions were implanted in a MgO(100)
substrate at various temperatures and the substrate was subsequently annealed at 1000oC for 10
hours in air. These samples were analyzed using a combination of atom probe tomography and
analytical electron microscopy. Also analyzed for the first time, are the samples obtained from
the reductive biotransformation of 6-line ferrihydrite located within porous silica (intragrain
ferrihydrite) by Shewanella oneidensis MR-1. Imaging and analysis of biologically induced Fe-
phosphate precipitates in porous silica using He-ion microscopy and atom probe tomography will
be outlined. Selected results from EMSL user projects related to semiconductor and nuclear
energy materials will also be discussed. Dopant distribution and the oxidation mechanisms will
be predicted based on the atom probe analysis in these systems. Dual beam FIB/SEM systems at
EMSL have been extensively used for sample preparations and some of the key observations
during sample preparations will also be outlined in this presentation. |
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