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| Title | Kim, Yoon-Jun;Tao, Runzhe; Klie, Robert F.; Seidman David N. | Year  |
Direct Atomic-Scale Imaging of Hydrogen and Oxygen Interstitials in Pure Niobium Using Atom-Probe Tomography and Aberration-Corrected Scanning Transmission Electron Microscopy | Abbreviated Journal | Journal Article | ||
| Issue | 2013 | Keywords | ACS Nano | ||||
| Address | ACS Nano | ||||||
| Thesis | 7 | ||||||
| Place of Publication | 1 | Language | 732-739 | Original Title | |||
| Series Title | Series Volume | Edition | |||||
| ISBN | Area | Conference | |||||
| Approved | |||||||
| Serial | Orig Record | no | NU @ michaeljsrawlings @ | 11463 | |||
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