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Nam, A. J.; Teren, A.; Lusby, T. A.; Melmed, A. J. |
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Benign making of sharp tips for STM and FIM: Pt, Ir, Au, Pd, and Rh |
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Journal Article |
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1995 |
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Abstract |
Journal of Vacuum Science & Technology A |
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J. Vac. Sci. Technol. A |
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13B |
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4 |
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1556-1559 |
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Field Ion Microscopy |
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Abbreviated Series Title |
Sharp tips for various modern microscopies, such as field-ion microscopy ~FIM! and scanning
tunneling microscopy ~STM!, can be prepared by electropolishing in solutions which are relatively
innocuous for the environment as well as the researcher, compared to the often hazardous solutions
still in widespread use.We have made measurements of polishing times as a function of solution and
voltage parameters and we report conditions for electropolishing sharp tips of Pt, Ir, Au, Pd, and Rh
using relatively benign solutions. |
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2761 |
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