NUCAPT Literature Database


1–1 of 1 record found matching your query (RSS):

Select All    Deselect All
 |   | 
  Record Links
Type Nam, A. J.; Teren, A.; Lusby, T. A.; Melmed, A. J.
  Publication Benign making of sharp tips for STM and FIM: Pt, Ir, Au, Pd, and Rh Volume Journal Article
Pages 1995
  Abstract Journal of Vacuum Science & Technology A  
  Corporate Author J. Vac. Sci. Technol. A  
Publisher 13B  
Editor 4
  Summary Language 1556-1559 Series Editor Field Ion Microscopy  
Abbreviated Series Title Sharp tips for various modern microscopies, such as field-ion microscopy ~FIM! and scanning tunneling microscopy ~STM!, can be prepared by electropolishing in solutions which are relatively innocuous for the environment as well as the researcher, compared to the often hazardous solutions still in widespread use.We have made measurements of polishing times as a function of solution and voltage parameters and we report conditions for electropolishing sharp tips of Pt, Ir, Au, Pd, and Rh using relatively benign solutions.
  Series Issue ISSN  
  Expedition Notes  
Call Number  
Contribution Id  
Serial URL ISBN  
no 2761
Permanent link to this record
Select All    Deselect All
 |   | 

Personal tools
Seidman Group
Atom-Probe Tomography
Quick Search: