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| Record | |||||||
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| Title | Koops, P., H W; Kretz, J.; Rudolph, M.; Weber, M.; Dahm, G.; Lee, K. L. | Year | Characterization and application of materials grown by electron-beam-induced deposition | Abbreviated Journal | Journal Article | ||
Issue  |
1994 | Keywords | Japanese Journal of Applied Physics | ||||
| Address | Jpn. J. Appl. Phys. | ||||||
| Thesis | 33 | ||||||
| Place of Publication | Language | 7099-7107 | Original Title | Scanning Tunnelling Microscopy | |||
| Series Title | Series Volume | Edition | |||||
| ISBN | Area | Conference | |||||
| Approved | |||||||
| Serial | Orig Record | no | 3083 | ||||
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