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| Record | |||||||
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| Title | Burke, M. G.; Sieloff, D. D.; Brenner, S. S. | Year | A combined TEM/FIM examination of field emission as a FIM specimen preparation technique | Abbreviated Journal | Journal Article | ||
| Issue | 1986 | Keywords | Journal de Physique | ||||
| Address | J. de Phys. | ||||||
| Thesis | 47-C7 | ||||||
| Place of Publication | Language | 459-462 | Original Title | FIM specimen preparation field emission TEM; Field Ion Microscopy | |||
| Series Title | Series Volume | Edition | |||||
| ISBN | Area | Conference | |||||
| Approved | |||||||
| Serial | Orig Record | no | 3506 | ||||
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