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Type Burke, M. G.; Sieloff, D. D.; Brenner, S. S.
  Publication (up) A combined TEM/FIM examination of field emission as a FIM specimen preparation technique Volume Journal Article
Pages 1986
  Abstract Journal de Physique  
  Corporate Author J. de Phys.  
Publisher 47-C7  
Editor
  Summary Language 459-462 Series Editor FIM specimen preparation field emission TEM; Field Ion Microscopy  
Abbreviated Series Title
  Series Issue ISSN  
Medium
  Expedition Notes  
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Contribution Id  
Serial URL ISBN  
no 3506
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