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Type Perea, Daniel E.; Allen, John E.; May, Stephen J.; Wessels, Bruce, W.; Seidman, David N.; Lauhon, Lincoln J.
  Publication Three-Dimensional Nanoscale Composition Mapping of Semiconductor Nanowires Volume Journal Article
Pages 2006
  Abstract Nano Letters  
  Corporate Author  
Publisher 6  
Editor 2
  Summary Language 181-185 Series Editor LEAP  
Abbreviated Series Title We demonstrate the three-dimensional composition mapping of a semiconductor nanowire with single-atom sensitivity and subnanometer spatial resolution using atom probe tomography. A new class of atom probe, the local electrode atom probe (LEAP) microscope, was used to map the position of single Au atoms in an InAs nanowire and to image the interface between a Au catalyst and InAs in three dimensions with 0.3-nm resolution. These results establish atom probe tomography as a uniquely powerful tool for analyzing the chemical composition of semiconductor nanostructures.
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Medium
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no NU @ karnesky @ 416
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