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	Record
	Type	Gerstl, Stephan S. A.; Seidman, David, N.; Gribb, Amy A.; Kelly, Thomas F.
	Publication	LEAP Microscopes look at TiAl Alloys	Volume	Journal Article
Pages	2004
	Abstract	Advanced Materials & Processes
	Corporate Author
Publisher	162
Editor	10
	Summary Language	31-33	Series Editor	LEAP
Abbreviated Series Title	The Local-Electron Atom-Probe (LEAP) microscope helps to investigate how nanoscale precipitates strengthen TiAl alloys at elevated temperatures and stresses in proposed jet engine and aerospace applications.
	Series Issue		ISSN
Medium
	Expedition		Notes
Call Number
Contribution Id
Serial		URL		ISBN
					no	NU @ karnesky @	657
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