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Gerstl, Stephan S. A.; Seidman, David, N.; Gribb, Amy A.; Kelly, Thomas F.
Publication
LEAP Microscopes look at TiAl Alloys
Volume
Journal Article
Pages
2004
Abstract
Advanced Materials & Processes
Corporate Author
Publisher
162
Editor
10
Summary Language
31-33
Series Editor
LEAP
Abbreviated Series Title
The Local-Electron Atom-Probe (LEAP) microscope helps to investigate how nanoscale precipitates strengthen TiAl alloys at elevated temperatures and stresses in proposed jet engine and aerospace applications.
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NU @ karnesky @
657
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