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| Record | |||||||
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| Title | Gerstl, Stephan S. A.; Seidman, David, N.; Gribb, Amy A.; Kelly, Thomas F. | Year | LEAP Microscopes look at TiAl Alloys | Abbreviated Journal | Journal Article | ||
| Issue | 2004 | Keywords | Advanced Materials & Processes | ||||
| Address | |||||||
| Thesis | 162 | ||||||
| Place of Publication | 10 | Language | 31-33 | Original Title  |
LEAP | ||
| Series Title | The Local-Electron Atom-Probe (LEAP) microscope helps to investigate how nanoscale precipitates strengthen TiAl alloys at elevated temperatures and stresses in proposed jet engine and aerospace applications. | Series Volume | Edition | ||||
| ISBN | Area | Conference | |||||
| Approved | |||||||
| Serial | Orig Record | no | NU @ karnesky @ | 657 | |||
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