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Type Gerstl, Stephan S. A.; Seidman, David, N.; Gribb, Amy A.; Kelly, Thomas F.
  Publication LEAP Microscopes look at TiAl Alloys Volume Journal Article
Pages 2004
  Abstract Advanced Materials & Processes  
  Corporate Author  
Publisher 162  
Editor 10
  Summary Language 31-33 Series Editor LEAP  
Abbreviated Series Title The Local-Electron Atom-Probe (LEAP) microscope helps to investigate how nanoscale precipitates strengthen TiAl alloys at elevated temperatures and stresses in proposed jet engine and aerospace applications.
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no NU @ karnesky @ 657
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