| Author |
Title |
Year |
Publication |
Volume |
Pages  |
| Kuchibhatla, Satyanarayana V. N. T.; Shutthanandan, V; Prosa, T. J.; Adusumilli, P.; Arey, B.; Buxbaum, A.; Wang, Y. C.; Tessner, T.; Ulfig, R.; Wang, C. M.; Thevuthasan, S. |
Three-dimensional chemical imaging of embedded nanoparticles using atom probe tomography |
2012 |
Nanotechnology |
23 |
215704 |
| Kim, Y.-C.; Adusumilli, P.; Lauhon, L.J.; Seidman, D.N.; Jung, S.-Y.; Lee, H.-D.; Alvis, R.L.; Ulfig, R.M.; Olson, J.D. |
Three-dimensional atomic-scale mapping of Pd in Ni[sub:1 - x]Pd[sub:x]Si/Si(100) thin films |
2007 |
Applied Physics Letters |
91 |
113106:1-3 |
| Adusumilli, Praneet; Lauhon, Lincoln J.; Seidman, David N.; Murray, Conal E.; Avayu, Ori; Rosenwaks, Yossi |
Tomographic study of atomic-scale redistribution of platinum during the silicidation of Ni0.95Pt0.05/Si(100) thin films |
2009 |
Applied Physics Letters |
94 |
113103_1-3 |
| Mao, Zugang; Kim, Yeong-Cheol; Lee, Hi-Deok; Adusumilli, Praneet; Seidman, David N. |
NiSi crystal structure, site preference, and partitioning behavior of palladium in NiSi(Pd)/Si(100) thin films: Experiments and calculations |
2011 |
Applied Physics Letters |
99 |
013106 |
| Lauhon, Lincoln J.; Adusumilli, Praneet; Ronsheim, Paul; Flaitz, Philip L.; Lawrence, Dan |
Atom-Probe Tomography of Semiconductor Materials and Device Structures |
2009 |
MRS Bulletin |
34 |
738-743 |
| Adusumilli, Praneet; Murray, Conal E.; Lauhon, Lincoln J.; Avayu, Ori; Rosenwaks, Yossi; Seidman, David N. |
Three-Dimensional Atom-Probe Tomographic Studies of Nickel Monosilicide/Silicon Interfaces on a Subnanometer Scale |
2009 |
ECS Transactions |
19 |
303-314 |
| Thevuthasan, S.; Kuchibhatla, Satyanarayana, V. N. T.; Adusumilli, P.; Olszta, M.; Arey, B.; Shutthanandan, V.; McKinely, J. P.; Wang, C. M.; Bruemmer, S.; Baer, D. R.; Prosa, T.; Ulfig, R.; Seidman, D.; Buxbaum, A.; Wang, Y. C.; Tessner, T. |
Laser Assisted Atom Probe Tomography analysis of nanoscale, energy and environment related materials at EMSL |
2010 |
Microscopy and Microanalysis |
|
|
| Kuchibhatla, Satyanarayana, V. N. T.; Adusumilli, P.; Prosa, T. J.; Ulfig, R. M.; Shutthanandan, V.; Arey, B. W.; Thevuthasan, S. |
Influence of embedded Au-nanoclusters on the Atom Probe Tomography of Bulk MgO |
2010 |
Advances in Optical and Electron Microscopy, Vol. 2, R. Barer and V. E. Cosslett, eds., Academic Press, London (1968) 343analysis |
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