Author  |
Title |
Year |
Publication |
Volume |
Pages |
| Kratschmer, E.; Kim, H. S.; Thomason, R., M G; Lee, K. Y.; Rishton, S. A.; Yu, M. L.; Chang, P., T H |
Sub-40 nm resolution 1 keV scanning tunneling microscope field-emission microcolumn |
1994 |
Journal of Vacuum Science & Technology A |
B12 |
3503-3507 |
| Kwon, H.; Barlat, F.; Lee, M.; Chung, Y.; Uhm, S. |
Influence of Tempering Temperature on Low Cycle Fatigue of High Strength Steel |
2014 |
ISIJ International |
54 |
979-984 |
| Lagow, B.W.; Robertson, I.M.; Jouiad, M.; Lassila, D.H.; Lee, T.C.; Birnbaum, H.K. |
Observation of dislocation dynamics in the electron microscope |
2001 |
Materials Science And Engineering A |
309-310 |
445-450 |
| Lee, B.; Barasch, E. F.; Mazumdar, T.; McIntyre, P. M.; Pang, Y.; Trost, H. - J. |
Development of knife-edge field emission cathodes on (110) silicon wafers |
1993 |
Applied Surface Science |
67 |
|
| Lee, B.; Elliott, T. S.; Mazumdar, T. K.; McIntyre, P. M.; Pang, Y.; Trost, H. - J. |
Knife-edge thin film field emission cathodes on (110) silicon wafers |
1994 |
Journal of Vacuum Science & Technology A |
B12 |
644-647 |
| Lee, B.; Min, S. - W.; Bang, J. - H.; Hwang, D. - S.; Kwon, T. - J. |
Modeling of tunneling current at field emission display tips: for non-metallic tips and an analytic method of solving for electric fields |
1996 |
Int. Vac. Microelectron. Conf., 9th (1996), 97-101 Publisher: Nevskii Kur'er, St. Petersburg, Russia |
|
97-101 |
| Lee, B.C.; Park, J.K. |
Effect of the addition of Ag on the strengthening of Al3Li phase in Al-Li single crystals |
1998 |
Acta Materialia |
46 |
4181-4187 |
| Lee, Byeong-Joo; Jang, Je-Wook |
A modified embedded-atom method interatomic potential for the Fe–H system |
2007 |
Acta Materialia |
55 |
6779-6788 |
| Lee, C. G.; Ahn, H. Y.; Lee, J. D. |
Scaling-down of cone-like field emitter using LOCOS |
1995 |
Tech. Dig. |
|
401-404 |
| Lee, C. G.; Ahn, H. Y.; Lee, J. D.; Park, H. S. |
A new approach to manufacturing field emitter arrays with submicron gate apertures |
1995 |
Tech. Dig. |
|
14-17 |
