| |
Author |
Title |
Year |
Publication |
Volume  |
Pages |
Links |
|
|
Bakhtizin, R. Z.; Valeev, V. G.; Kukharenko, Y. A. |
Inelastic energy losses at electron tunneling through potential barriers |
1987 |
Journal de Physique |
48-C6 |
|
|
|
|
Lee, B.C.; Park, J.K. |
Effect of the addition of Ag on the strengthening of Al3Li phase in Al-Li single crystals |
1998 |
Acta Materialia |
46 |
4181-4187 |
|
|
|
Muraleedharan, K.; Balamuralikrishnan, R.; Das, N. |
TEM and 3D atom probe characterization of DMS4 cast nickel-base superalloy |
2009 |
Journal of Materials Science |
44 |
2218-2225 |
|
|
|
Ahmad, Zaki; Ul-Hamid, Anwar; B.J., Abdul-Aleem |
The corrosion behavior of scandium alloyed Al 5052 in neutral sodium chloride solution |
2001 |
Corrosion Science |
43 |
1227-1243 |
|
|
|
Donders, P. J.; Lee, G., M J |
Observation of electron-hole cascade in photofield emission |
1990 |
Physical Review |
B41 |
|
|
|
|
Veerababu, R.; Balamuralikrishnan, R.; Muraleedharan, K.; Srinivas, M. |
Three-dimensional atom probe investigation of microstructural evolution during tempering of an ultra-high-strength high-toughness steel |
2008 |
Metallurgical And Materials Transactions A-Physical Metallurgy And Materials Science |
39a |
1486-1495 |
|
|
|
Harvey, R. J.; Lee, R. A.; Miller, A. J.; Wigmore, J. K. |
Aspects of field emission from silicon diode arrays |
1991 |
IEEE Transactions on Electron Devices |
38 |
|
|
|
|
Jung, Y. H.; Ju, B. K.; Jung, J. H.; Lee, Y. H.; Oh, M. H.; Kim, C. J. |
Characteristics on the gate insulator of metal tip field emitter arrays after wetting etching process |
1997 |
Japanese Journal of Applied Physics |
36 |
3576-3579 |
|
|
|
Lee, C. R. A., N A; Patel, C. |
Wet etching of cusp structures for field-emission devices |
1989 |
IEEE Trans. Electr. Devices |
36 |
|
|
|
|
Lee, R. A.; Patel, C.; Williams, H. A.; Cade, N. A. |
Semiconductor fabrication technology applied to micrometer valves |
1989 |
IEEE Trans. Electr. Devices |
36 |
|
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