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Menand, A.; Martin, C.; Gallot, J. Description of a field ion microscope (French) 1972 Rev Phys Appl 7 details   openurl
Martin, A.; Block, J. A field ion source with electrical mass filter 1973 Messtechnik 81 details   openurl
Jones, J. P.; Martin, A. D. High field microscopy of nickel on tungsten 1974 Surface Science 41 details   openurl
Cetronio, A.; Jones, J. P.; Martin, A. D. Computer simulation of ion images as an aid to indexing small crystallites 1974 Surface Science 44 details   openurl
Walls, J. M.; Martin, A. D.; Southworth, H. N. Combined FIM AES and LEED study of the structure and composition of ion- bombarded W surfaces 1975 Surface Science 50 details   openurl
Sarrau, J. M.; Martin, C.; Gallot, J. An atom probe field ion microscope calibrated using tantalum a single isotope metal (French) 1975 C. R. Hebd. Seances Acad. Sci. B 281 details   openurl
Sarrau, J. M.; Bostel, A.; Martin, C.; Gallot, J. C. R. Atom probe determination of time of flight in a hyperboloidal sample model (French) 1976 C. R. Hebd. Seances Acad. Sci. B 283 details   openurl
Sarrau, J. M.; Martin, C.; Bostel, A.; Gallot, J. C. R. A spectral resolution method for an atom probe field ion microscope (French) 1976 C. R. Hebd. Seances Acad. Sci. B 282 details   openurl
Krishnaswamy, S. V.; Martinka, M.; Müller, E. W. Multilayer field evaporation patterns 1977 Surface Science 64 details   openurl
Sarrau, J. M.; Bostel, A.; Martin, C.; Gallot, J. C. R. Atom probe: experimental results on tungsten and iron-aluminum alloy samples 1978 C. R. Hebd. Seances Acad. Sci., Ser. B 286, details   openurl
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