| |
Author  |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
|
Walck, S. D.; Hren, J. J. |
FIM/IAP/TEM studies of ion implanted nickel emitters |
1985 |
Mater. Res. Soc. Symp. Ser., Adv. Photon Part. Tech. Charact. Defects Solids, |
41, |
|
|
|
|
Walck, S. D.; Hren, J. J. |
FIM/IAP depth profiling of nitrogen-implanted field emitters |
1986 |
Microbeam Anal. |
21 |
|
|
|
|
Walck, S. D.; Buyuklimanli, T.; Hren, J. J. |
Extended depth profiling with the IAP |
1986 |
Journal de Physique |
47-C2 |
|
|
|
|
Wagner, R.; Brenner, S. S. |
Morphology and chemistry of internally nitrided Fe-3 at. % Mo |
1978 |
Acta Metall. |
26 |
|
|
|
|
Wadman, B.; Andren, H. O.; Falk, L. K. L. |
Atom probe analysis of thin oxide layers on zircaloy needles |
1989 |
Journal de Physique |
50-C8 |
|
|
|
|
Wadman, B.; Andren, H. O. |
Direct measurement of matrix composition in zircaloy-4 |
1989 |
Proc 8th Intl Symp Zirconium Nucl Inc ASTM STP |
1023 |
|
|
|
|
Vurpillot, F.; Renaud, L.; Blavette, D. |
A New Step Towards the Lattice Reconstruction in 3DAP |
2003 |
Ultramicroscopy |
95 |
223-229 |
|
|
|
Vladimirov, V. V.; Gabovich, M. D.; Nazarenko, O. K. |
Desintegration of charged drop in the supercritical Rayleigh regime |
1994 |
Pis'ma Zh. Tekh. Fiz (1994) 20, 7-10; Tech. Phys. Lett. (1994) 20, (1994) 343-44 |
20 |
7-10 |
|
|
|
Venkateswarlu, K.; Rajinikanth, V.; Ray, Ajoy Kumar; Xu, Cheng; Langdon, Terence G. |
The characteristics of aluminum-scandium alloys processed by ECAP |
2010 |
Materials Science and Engineering: A |
527 |
1448-1452 |
|
|
|
Vaumousse, D.; Cerezo, A.; Warren, P. J.; Court, S. A. |
An atom probe study of fine scale structure in AlMgSi(Cu) alloys |
2002 |
Materials Science Forum |
396-4 |
693-698 |
|
