| |
Author  |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
|
Cantor, B.; Allen, C. M.; Dunin-Burkowski, R.; Green, M. H.; Hutchinson, J. L.; O'Reilly, Q., K A; Petford-Long, A. K.; Schumacher, P.; Sloan, J.; Warren, P. J. |
Applications of nanocomposites |
2001 |
Scripta Materialia |
44 |
2055-2059 |
|
|
|
Carreno, F.; Eddahbi, M.; Ruano, O. A. |
Creep Behaviour of Three Dispersion-Strengthened Al-Fe-V-Si Materials |
1997 |
Journal of Materials Science Letters |
16 |
1728-1730 |
|
|
|
Causey, R.; Hsu, W.; Mills, B.; Ehrenberg, J.; Phillips, V. |
Tritium Retention And Migration In Beryllium |
1990 |
Journal Of Nuclear Materials |
176 |
654-660 |
|
|
|
Cerezo, A.; Abraham, M.; Clifton, P.; Lane, H.; Larson, D. J.; Petford-Long, A. K.; Thuvander, M.; Warren, P. J.; Smith, W., G D |
Three-dimensional atomic scale analysis of nanostructured materials |
2001 |
Micron |
32 |
731-739 |
|
|
|
Cerezo, A.; Abraham, M.; Lane, H.; Larson, D. J.; Thuvander, M.; Seto, K.; Warren, P. J.; Smith, W., G D |
Three-dimensional atomic scale analysis of interfaces |
1999 |
Electron Microsc. Anal. 1999 |
161 |
29-34 |
|
|
|
Cerezo, A.; Gibuoin, D.; Kim, S.; Sijbrandij, S. J.; Venker, F. M.; Warren, P. J.; Wilde, J.; Smith, W., G D |
Materials applications of an advanced 3-dimensional atom probe |
1996 |
Journal de Physique IV |
6 |
205-210 |
|
|
|
Cerezo, A.; Godfrey, T. J.; Sijbrandij, S. J.; Smith, G. D. W.; Warren, P. J. |
Performance of an energy-compensated three-dimensional atom probe |
1998 |
Review of Scientific Instruments |
69 |
49-58 |
|
|
|
Cerezo, A.; Godfrey, T. J.; Sijbrandij, S. J.; Smith, W., G D; Warren, P. J. |
Performance of an energy-compensated three-dimensional atom probe |
1998 |
Rev. Sci. Inst. |
69 |
49-58 |
|
|
|
Cerezo, A.; Hyde, J. M.; Miller, M. K.; Beverini, G.; Setna, R. P.; Warren, P. J.; Smith, W., G D |
New dimensions in atom-probe analysis |
1992 |
Surface Science |
266 |
|
|
|
|
Cerezo, A.; Hyde, J. M.; Miller, M. K.; Beverini, G.; Setna, R. P.; Warren, P. J.; Smith, W., G D |
New dimensions in atom probe analysis |
1992 |
Surface Science |
266 |
|
|
