| |
Author |
Title |
Year |
Publication |
Volume |
Pages  |
Links |
|
|
Grenga, H.; Hochman, R. |
Gas-metal interactions field ion and field emission microscopy |
1969 |
Appl. of Field Ion Microsc. in Physical Metallurgy and Corrosion |
|
391 |
|
|
|
Sauvage, X.; Renaud, L.; Deconihout, B.; Blavette, D.; Ping, D. H.; Hono, K. |
Solid state amorphization in cold drawn Cu/Nb wires |
2001 |
Acta Materialia |
49 |
389-394 |
|
|
|
Grant, S. P.; Earp, S. L.; Brenner, S. S.; Burke, M. G. |
Phenomenological modeling of radiation embrittlement in light water reactor vessels with atom probe and statistical analysis |
1986 |
Proc. Intl. Symp. Environ. Degrad. Mater. Nucl. Power Syst.-Water React., 2nd, , Am. Nucl. Soc., La Grange Park, IL (1986) 385-392 |
|
385-392 |
|
|
|
Hyde, J. M.; Cerezo, A.; Setna, R. P.; Warren, P. J.; Smith, W., G D |
Lateral and depth scale calibration of the position sensitive atom probe |
1994 |
Applied Surface Science |
76/77 |
382-391 |
|
|
|
Current, Michael I.; Seidman, David N. |
Sputtering of tungsten: a direct view of a near surface depleted zone created by a single 30 keV63 Cu+ projectile |
1980 |
Nuclear Instruments and Methods |
170 |
377-381 |
|
|
Kelly, T. E.; Gribb, T. T.; Olson, J. D.; Martens, R. L.; Shepard, J. D.; Wiener, S. A.; Kunicki, T. C.; Ulfig, R. M.; Lenz, D. R.; Strennen, E. M.; Oltman, E.; Bunton, J. H.; Strait, D. R. |
First Data from a Commercial Local Electrode Atom Probe (LEAP) |
2004 |
Microscopy and Microanalysis |
10 |
373-383 |
|
|
|
Burke, M. G.; Brenner, S. S. |
Applications of atom-probe field-ion microscopy to segregation and clustering studies in materials science |
1986 |
Microbeam Anal. |
21 |
363-369 |
|
|
|
Hren, J. J.; Liu, J. |
Field emission, field ion microscopy, and the atom probe |
1994 |
Microanal. Solids, B. G.Yacobi, D.B. Holt, and L.L. Kazmerski, eds., Plenum Publishing, New York, NY (1994) 359-87 |
|
359-387 |
|
|
|
Dong, Y.; Etienne, A.; Frolov, A.; Fedotova, S.; Fujii, K.; Fukuya, K.; Hatzoglou, C.; Kuleshova, E.; Lindgren, K.; London, A.; Lopez, A.; Lozano-Perez, S.; Miyahara, Y.; Nagai, Y.; Nishida, K.; Radiguet, B.; Schreiber, D.K.; Soneda, N.; Thuvander, M.; Toyama, T.; Wang, J.; Sefta, F.; Chou, P.; Marquis, E.A. |
Atom Probe Tomography Interlaboratory Study on Clustering Analysis in Experimental Data Using the Maximum Separation Distance Approach |
2019 |
|
25 |
356-366 |
|
|
|
Wang, Q.; Kinkus, T. J.; Ren, D. G. |
Markov process analysis of atom probe data |
1990 |
Chinese Physics Letters |
7 |
353 |
|
