| |
Author |
Title |
Year |
Publication |
Volume |
Pages  |
Links |
|
|
Vaumousse, D.; Cerezo, A.; Warren, P. J.; Court, S. A. |
An atom probe study of fine scale structure in AlMgSi(Cu) alloys |
2002 |
Materials Science Forum |
396-4 |
693-698 |
|
|
|
Ding, M. Q.; Choi, W. B.; Myers, A. F.; Sharma, A. K.; Narayan, J.; Cuomo, J. J.; Hren, J. J. |
Field emission enhancement from Mo tip emitters coated with N containing amorphous diamond films |
1997 |
Surf. Coat. Technol. |
94/95 |
672-675 |
|
|
|
Causey, R.; Hsu, W.; Mills, B.; Ehrenberg, J.; Phillips, V. |
Tritium Retention And Migration In Beryllium |
1990 |
Journal Of Nuclear Materials |
176 |
654-660 |
|
|
|
Frykholm, R.; Jansson, B.; Andren, H. O. |
Methods for atom probe analysis of microgradients in functionally graded cemented carbides |
2002 |
Micron |
33 |
639-646 |
|
|
|
Stiller, K.; Andren, H.O.; Andersson, M. |
Precipitation in maraging and martensitic chromium steels - what can we learn using 3-DAP and EFTEM |
2008 |
Materials Science And Technology |
24 |
633-640 |
|
|
|
Ostberg, G.; Jansson, B.; Andren, H. O. |
On spinodal decomposition in the Co-W system |
2006 |
Scripta Materialia |
54 |
595-598 |
|
|
|
Leitner, H.; Stiller, K.; Andren, H. - O.; Danoix, F. |
Conventional and tomographic atom probe investigations of secondary-hardening carbides |
2004 |
Surf. Interface Anal. |
36 |
540-545 |
|
|
|
Murakami, H.; Warren, P. J.; Kumeta, T.; Koizumi, Y.; Harada, H. |
Microstructural evolution of b2 (NiTi-based) / b'(Ni2TiAl-based) two phase quaternary alloys |
1997 |
J. Surf. Analysis |
3 |
516-520 |
|
|
|
Nie, Zuo-ren; Jin, Tou-nan; Zou, Jing-xia; Fu, Jing-bo; Yang, Jin-jun; Zuo, Tie-yong |
Development on research of advanced rare-earth aluminum alloy |
2003 |
Transactions of Nonferrous Metals Society of China |
13 |
509-514 |
|
|
|
Sha, Gang; Yao, Lan; Liao, Xiaozhou; Ringer, Simon P.; Chao Duan, Zhi; Langdon, Terence G. |
Segregation of solute elements at grain boundaries in an ultrafine grained Al-Zn-Mg-Cu alloy |
2011 |
Ultramicroscopy |
111 |
500-505 |
|
