| |
Author |
Title |
Year |
Publication |
Volume |
Pages  |
Links |
|
|
Hu, Q. - H.; Stiller, K.; Olsson, E.; Andren, H. - O.; Berastegui, P.; Johansson, G. |
Synthesis and atom probe microanalysis of YBa2Cu306+d ceramics |
1994 |
Physica C |
235-240 |
431-432 |
|
|
|
Fu, Jingbo; Nie, Zuoren; Jin, Tounan; Zou, Jingxia; Zuo, Tieyong |
Effect of Er on Aging Behavior of 1420 Alloy |
2005 |
Journal of Rare Earths |
23 |
430-433 |
|
|
|
Prosa, T.J.; Strennen, S.; Olson, D.; Lawrence, D.; Larson, D.J. |
A Study of Parameters Affecting Atom Probe Tomography Specimen Survivability |
2019 |
|
25 |
425-437 |
|
|
|
Rendulic, K. |
Corrosion of field ion microscope specimens |
1969 |
Appl. of Field Ion Microsc. in Physical Metallurgy and Corrosion |
|
413 |
|
|
|
Seol, J.; Lim, N.; Lee, B.; Renaud, L.; Park, C. |
Atom probe tomography and nano secondary ion mass spectroscopy investigation of the segregation of boron at austenite grain boundaries in 0.5 wt.% carbon steels |
2011 |
Metals and Materials International |
17 |
413-416 |
|
|
|
Current, M. I.; Wei, C. Y.; Seidman, D. N. |
Direct observation of the primary state of damage of ion-irradiated tungsten: II. Definitions and results |
1983 |
Philosophical Magazine A |
47 |
407-434 |
|
|
|
Larson, David J.;Prosa, Ty J.; Lawrence, Dan;Geiser, Brian P.; Jones, Clive M.; Kelly, Thomas F. |
Atom Probe Tomography for Microelectronics |
2012 |
Chapter 10 in: Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization |
1 |
407-477 |
|
|
|
VanGenderen, M. J.; Sijbrandij, S. J.; Böttger, A.; Mittemeijer, E. J.; Smith, W., G D |
Atom probe analysis of the first stage of tempering of iron-carbon-nitrogen martensite |
1997 |
Zeitschrift für Metallkunde |
88 |
401-409 |
|
|
|
Audiffren, M.; Traimond, P.; Bardon, J.; Drechsler, M. |
Study of two-dimensional aggregates of W by field-ion microscopy (French) |
1977 |
3rd Coll. Intl. Phys. Chim. Surf Solides, Grenoble |
|
401 |
|
|
|
Rolander, U.; Andren, H. - O. |
Study of proper conditions for quantitative atom-probe analysis |
1994 |
Applied Surface Science |
76/77 |
392-402 |
|
