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Author |
Title |
Year |
Publication  |
Volume |
Pages |
Links |
|
|
Ren, D. M.; Tsong, T. T.; Liu, W.; Qin, J. H. |
Surface segregation of Pt-Rh and Pt-Ru alloys |
1990 |
J. Electron. Sci. Tech. (Chinese) |
Suppl. 1 |
|
|
|
|
Liu, W.; Ren, D. M. |
The study of elementary steps of surface chemical process by using pulsed laser atom probe |
1990 |
J. Electron. Sci. Tech. (Chinese) |
Suppl. 1 |
|
|
|
|
Liu, W.; Chen, H. N.; Liu, L. M.; Ren, D. M. |
Several key assemblies specially designed for the FEM-FIM-IAP system |
1990 |
J. Electron. Sci. Tech. (Chinese) |
Suppl. 1 |
|
|
|
|
Ren, D. M.; Liu, L. M.; Huang, G. M.; Chen, H. N.; Liu, W. |
The vacuum system of the FEM-FIM-IAP system |
1990 |
J. Electron. Sci. Tech. (Chinese) |
Suppl. 1 |
|
|
|
|
Hu, B. Y.; Liu, W.; Ren, D. M.; Xiao, S. S. |
An image processing facility specialized for the FEM-FM-IAP system |
1990 |
J. Electron. Sci. Tech. (Chinese) |
Suppl. 1 |
|
|
|
|
Ren, D. G. |
Atom probe and field ion microscope investigation of the negative creep mechanism in nickel-base superalloy |
1998 |
J. Mat. Proc. Tech. |
73 |
74-77 |
|
|
|
Brenner, S. S.; Miller, M. K. |
Atomic scale analysis with the atom probe |
1983 |
J. Met. |
35(3), |
|
|
|
|
Serena, P. A.; Escapa, L.; Saenz, J. J.; Garcia, N.; Rohrer, H. |
Coherent electron-emission from point sources |
1988 |
J. Microsc. |
152 |
|
|
|
|
Ranganathan, B. N.; Grenga, H. E. |
Hydrogen-ion image features of tempered martensite |
1973 |
J. Microsc. |
98 |
|
|
|
|
Miller, M. K.; Burke, M. G.; Brenner, S. S. |
Measurement of characteristic wavelengths in modulated microstructures by field-ion microscopy |
1985 |
J. Microsc. |
139, |
|
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