NUCAPT Literature Database

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Ren, D. M.; Tsong, T. T.; Liu, W.; Qin, J. H. Surface segregation of Pt-Rh and Pt-Ru alloys 1990 J. Electron. Sci. Tech. (Chinese) Suppl. 1 details   openurl
Liu, W.; Ren, D. M. The study of elementary steps of surface chemical process by using pulsed laser atom probe 1990 J. Electron. Sci. Tech. (Chinese) Suppl. 1 details   openurl
Liu, W.; Chen, H. N.; Liu, L. M.; Ren, D. M. Several key assemblies specially designed for the FEM-FIM-IAP system 1990 J. Electron. Sci. Tech. (Chinese) Suppl. 1 details   openurl
Ren, D. M.; Liu, L. M.; Huang, G. M.; Chen, H. N.; Liu, W. The vacuum system of the FEM-FIM-IAP system 1990 J. Electron. Sci. Tech. (Chinese) Suppl. 1 details   openurl
Hu, B. Y.; Liu, W.; Ren, D. M.; Xiao, S. S. An image processing facility specialized for the FEM-FM-IAP system 1990 J. Electron. Sci. Tech. (Chinese) Suppl. 1 details   openurl
Ren, D. G. Atom probe and field ion microscope investigation of the negative creep mechanism in nickel-base superalloy 1998 J. Mat. Proc. Tech. 73 74-77 details   openurl
Brenner, S. S.; Miller, M. K. Atomic scale analysis with the atom probe 1983 J. Met. 35(3), details   openurl
Serena, P. A.; Escapa, L.; Saenz, J. J.; Garcia, N.; Rohrer, H. Coherent electron-emission from point sources 1988 J. Microsc. 152 details   openurl
Ranganathan, B. N.; Grenga, H. E. Hydrogen-ion image features of tempered martensite 1973 J. Microsc. 98 details   openurl
Miller, M. K.; Burke, M. G.; Brenner, S. S. Measurement of characteristic wavelengths in modulated microstructures by field-ion microscopy 1985 J. Microsc. 139, details   openurl
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