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Author |
Title  |
Year |
Publication |
Volume |
Pages |
Links |
|
|
Holzworth, M.R.; Rudawski, N.G.; Pearton, S.J.; Jones, K.S.; Lu, L.; Kang, T.S.; Ren, F.; Johnson, J.W. |
Characterization of the gate oxide of an AlGaN/GaN high electron mobility transistor |
2011 |
Applied Physics Letters |
98 |
122103-3 |
|
|
|
Bledzki, A. K.; Lieser, J.; Wacker, G.; Frenzel, H. |
Characterization of the surfaces of treated glass fibers with different methods of investigation |
1997 |
Compos. Interfaces |
5 |
41-53 |
|
|
|
Rendulic, K. D.; Knor, Z. |
Chemisorption and gas promoted field evaporation |
1967 |
Surface Science |
7 |
|
|
|
|
Liu, W.; Ren, D. M.; Bao, C. L.; Tsong, T. T. |
Chemisorption of CO and methanation on Rh surfaces at low temperature and low pressure, an atom-probe FIM study |
1987 |
Journal de Physique |
48-C6 |
|
|
|
|
Serena, P. A.; Escapa, L.; Saenz, J. J.; Garcia, N.; Rohrer, H. |
Coherent electron-emission from point sources |
1988 |
J. Microsc. |
152 |
|
|
|
|
Shieh, J. L.; Ren, R. J.; Shieh, T. J.; Klemer, D. P.; Chen, C. Y. |
Comparison of a triangular-shape field emitter array and flat surface-emitter vacuum diodes |
1993 |
Journal of Vacuum Science & Technology A |
B11 |
|
|
|
|
Kelwing, T.; Naumann, A.; Trentzsch, M.; Trui, B.; Herrmann, L.; Mutas, S.; Graetsch, F.; Carter, R.; Stephan, R.; Kücher, P.; Hansch, W. |
Comparison of MOCVD- and ALD-Deposited HfZrO[sub:4] Gate Dielectrics for 32-nm High-Performance Logic SOI CMOS Technologies |
2010 |
Electron Device Letters, IEEE |
31 |
1149-1151 |
|
|
|
Warren, P. J.; Grovenor, M., C R |
Comparison to STEM and atom probe methods for chemical analysis of grain boundaries in commercial Al alloys |
1995 |
Materials Science Forum |
189-190 |
115-120 |
|
|
|
Caballero, F.G.; Yen, Hung-Wei; Miller, M.K.; Yang, Jer-Ren; Cornide, J.; Garcia-Mateo, C. |
Complementary use of transmission electron microscopy and atom probe tomography for the examination of plastic accommodation in nanocrystalline bainitic steels |
2011 |
Acta Materialia |
In Press |
|
|
|
|
Ren, D. M.; Tsong, T. T. |
Composition depth profiles of PtRh alloys in surface segregation and cosegregation with sulfur impurities |
1987 |
Surface Science |
184 |
|
|
