NUCAPT Literature Database


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Miller, M. K.; Brenner, S. S.; Burke, M. G.; Soffa, W. A. Atom probe field-ion microscopy studies of triaxially modulated microstructures in iron-beryllium alloys 1984 Scr. Metall. 18, details   openurl
Murakami, H.; Warren, P. J.; Harada, H. Atom probe microanalyses of some Ni-base single crystal superalloys 1995 Proc. 3rd Intl. Charles Parsons Turbine Conf., April 25-27, 1995, Newcastle-upon-Tyne,UK, R. D. Conroy, M. J. Goulette and A. Strang, eds., Institute of Materials, London, UK, 1 343 details   openurl
Brenner, S. S.; Kellogg, G. L. Atom probe microanalysis of superconducting YBa[sub:2]Cu[sub:3]O[sub:7-x] 1988 Materials Research Society Symposium Proceedings 99 947-950 details   openurl
Soffa, W. A.; Brenner, S. S.; Miller, M. K. Atom probe studies of the decomposition spectrum in alloys 1984 Decomposition of Alloys: The Early Stages 227-232 details   url
Seol, J.; Lim, N.; Lee, B.; Renaud, L.; Park, C. Atom probe tomography and nano secondary ion mass spectroscopy investigation of the segregation of boron at austenite grain boundaries in 0.5 wt.% carbon steels 2011 Metals and Materials International 17 413-416 details   doi
Larson, David J.;Prosa, Ty J.; Lawrence, Dan;Geiser, Brian P.; Jones, Clive M.; Kelly, Thomas F. Atom Probe Tomography for Microelectronics 2012 Chapter 10 in: Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization 1 407-477 details   openurl
Dong, Y.; Etienne, A.; Frolov, A.; Fedotova, S.; Fujii, K.; Fukuya, K.; Hatzoglou, C.; Kuleshova, E.; Lindgren, K.; London, A.; Lopez, A.; Lozano-Perez, S.; Miyahara, Y.; Nagai, Y.; Nishida, K.; Radiguet, B.; Schreiber, D.K.; Soneda, N.; Thuvander, M.; Toyama, T.; Wang, J.; Sefta, F.; Chou, P.; Marquis, E.A. Atom Probe Tomography Interlaboratory Study on Clustering Analysis in Experimental Data Using the Maximum Separation Distance Approach 2019 25 356-366 details   doi
Gordon, Lyle Matthew; Tran, Lawrence; Joester, Derk Atom Probe Tomography of Apatites and Bone-Type Mineralized Tissues 2012 ACS Nano details   doi
Juraszek, J.; Grenier, A.; Teillet, J.; Cadel, E.; Tiercelin, N.; Monnet, I.; Toulemonde, M. Atom probe tomography of swift ion irradiated multilayers 2009 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 267 912-916 details   doi
Rolander, U.; Andren, H. O. Atom-probe analysis applied to TiC-Ni-based cemented carbides 1989 Proc 12th Intl Plansee Seminar Bildstein H and Ortner H M eds Metallwerk Plansee GmbH Reutee/Tirol Austria 2 details   openurl
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