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Author |
Title  |
Year |
Publication |
Volume |
Pages |
Links |
|
|
Warren, P. J.; Thuvander, M.; Abraham, M.; Lane, H.; Cerezo, A.; Smith, W., G D |
3-D atom probe studies of some nanostructured materials |
2000 |
Materials Science Forum |
343 |
701-708 |
|
|
|
Isheim, Dieter; Kaszpurenko, Jason; Yu, Dong; Mao, Zugang; Seidman, David N.; Arslan, Ilke |
3-D Atomic-Scale Mapping of Manganese Dopants in Lead Sulfide Nanowires |
2012 |
J. Phys. Chem. C |
116 |
6595-6600 |
|
|
|
Miller, M. K.; Brenner, S. S.; eds., |
32nd Intl. Field Emission Symposium, Wheeling, W. Va. |
1986 |
Journal de Physique |
47-C2 |
|
|
|
|
Burke, M. G.; Miller, M. K.; Brenner, S. S.; Soffa, W. A. |
A combined AEM/FIM study of precipitation in an Fe-25 at. % Be alloy |
1984 |
Anal. Electron Microsc., Proc. Workshop, D. B. Williams and D. C. Joy, eds., San Francisco Press, San Francisco, CA (1984) 157-160 |
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|
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|
|
Burke, M. G.; Sieloff, D. D.; Brenner, S. S. |
A combined TEM/FIM examination of field emission as a FIM specimen preparation technique |
1986 |
Journal de Physique |
47-C7 |
459-462 |
|
|
|
Leisch, M.; Rendulic, K. D. |
A combined time-of-flight spectrometer using field desorption and ion impact sputtering |
1992 |
Surface Science |
266 |
|
|
|
|
Rendulic, K. D. |
A comparison between FIM and LEED studies of surface reconstruction |
1970 |
Surface Science |
21 |
|
|
|
|
Everett, K. G.; Walck, S. D.; Schmid, G. M.; Hren, J. J. |
A field ion microscope - imaging atom probe study of the underpotential deposition of copper on platinum |
1984 |
Surface Science |
145, |
|
|
|
|
Ren, D. M.; Liu, W.; Hu, B. Y.; Zhou, G. E.; Qin, J. H. |
A FIM investigation of high temperature superconducting Bi2(Sr, Ca)3Cu2Oy |
1991 |
Surface Science |
246 |
|
|
|
|
Leisch, M.; Rendulic, K. D. |
A mass-spectrometric investigation of the incorporation of organic matter into electrodeposits |
1984 |
Z. Metall Kunde Bd |
75, |
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