| |
Author |
Title  |
Year |
Publication |
Volume |
Pages |
Links |
|
|
Miller, M. K.; Brenner, S. S.; Burke, M. G.; Soffa, W. A. |
Atom probe field-ion microscopy studies of triaxially modulated microstructures in iron-beryllium alloys |
1984 |
Scr. Metall. |
18, |
|
|
|
|
Murakami, H.; Warren, P. J.; Harada, H. |
Atom probe microanalyses of some Ni-base single crystal superalloys |
1995 |
Proc. 3rd Intl. Charles Parsons Turbine Conf., April 25-27, 1995, Newcastle-upon-Tyne,UK, R. D. Conroy, M. J. Goulette and A. Strang, eds., Institute of Materials, London, UK, |
1 |
343 |
|
|
|
Brenner, S. S.; Kellogg, G. L. |
Atom probe microanalysis of superconducting YBa[sub:2]Cu[sub:3]O[sub:7-x] |
1988 |
Materials Research Society Symposium Proceedings |
99 |
947-950 |
|
|
|
Soffa, W. A.; Brenner, S. S.; Miller, M. K. |
Atom probe studies of the decomposition spectrum in alloys |
1984 |
Decomposition of Alloys: The Early Stages |
|
227-232 |
|
|
|
Seol, J.; Lim, N.; Lee, B.; Renaud, L.; Park, C. |
Atom probe tomography and nano secondary ion mass spectroscopy investigation of the segregation of boron at austenite grain boundaries in 0.5 wt.% carbon steels |
2011 |
Metals and Materials International |
17 |
413-416 |
|
|
|
Larson, David J.;Prosa, Ty J.; Lawrence, Dan;Geiser, Brian P.; Jones, Clive M.; Kelly, Thomas F. |
Atom Probe Tomography for Microelectronics |
2012 |
Chapter 10 in: Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization |
1 |
407-477 |
|
|
|
Dong, Y.; Etienne, A.; Frolov, A.; Fedotova, S.; Fujii, K.; Fukuya, K.; Hatzoglou, C.; Kuleshova, E.; Lindgren, K.; London, A.; Lopez, A.; Lozano-Perez, S.; Miyahara, Y.; Nagai, Y.; Nishida, K.; Radiguet, B.; Schreiber, D.K.; Soneda, N.; Thuvander, M.; Toyama, T.; Wang, J.; Sefta, F.; Chou, P.; Marquis, E.A. |
Atom Probe Tomography Interlaboratory Study on Clustering Analysis in Experimental Data Using the Maximum Separation Distance Approach |
2019 |
|
25 |
356-366 |
|
|
|
Gordon, Lyle Matthew; Tran, Lawrence; Joester, Derk |
Atom Probe Tomography of Apatites and Bone-Type Mineralized Tissues |
2012 |
ACS Nano |
|
|
|
|
|
Juraszek, J.; Grenier, A.; Teillet, J.; Cadel, E.; Tiercelin, N.; Monnet, I.; Toulemonde, M. |
Atom probe tomography of swift ion irradiated multilayers |
2009 |
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms |
267 |
912-916 |
|
|
|
Rolander, U.; Andren, H. O. |
Atom-probe analysis applied to TiC-Ni-based cemented carbides |
1989 |
Proc 12th Intl Plansee Seminar Bildstein H and Ortner H M eds Metallwerk Plansee GmbH Reutee/Tirol Austria |
2 |
|
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