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Author |
Title  |
Year |
Publication |
Volume |
Pages |
Links |
|
|
Cai, G. - J.; Lundin, L.; Andren, H. - O.; Svensson, L. E. |
Atom-probe investigation of precipitation in 12% Cr steel weld metals |
1994 |
Applied Surface Science |
76/77 |
248-254 |
|
|
|
Menand, A.; Zapolsky-Tatarenko, H.; Nerac-Partaix, A. |
Atom-probe investigations of TiAl alloys |
1998 |
Materials Science and Engineering A |
A250 |
55-64 |
|
|
|
Soffa, W. A.; Brenner, S. S.; Camus, P. P.; Miller, M. K. |
Atom-probe studies of precipitation in iron-chromium-cobalt alloys |
1982 |
Proc. 29th IFES, Gothenburg |
|
|
|
|
|
Heck, P. R.; Pellin, M. J.; Davis, A. M.; Martin, I.; Renaud, I.; Benbalagh, R.; Isheim, D.; Seidman, D. N.; Hiller, J.; Stephan, T.; Lewis, R. S.; Savina, M. R.; Maine, A.; Elam, J.; Staermann, F. J.; Zhao, X.; Daulton, T. L.; Amari, S. |
Atom-Probe Tomographic Analyses of Presolar Silicon Carbide Grains and Meteoric Nanodiamonds – First Results on Silicon Carbide |
2010 |
|
|
|
|
|
|
Lauhon, Lincoln J.; Adusumilli, Praneet; Ronsheim, Paul; Flaitz, Philip L.; Lawrence, Dan |
Atom-Probe Tomography of Semiconductor Materials and Device Structures |
2009 |
MRS Bulletin |
34 |
738-743 |
|
|
|
Seidman, David N.; Current, Michael I.; Pramanik, Dipankar; Wei, Ching-Yeu |
Atomic resolution observations of the point defect structure of depleted zones in ion-irradiated metals |
1982 |
Journal of Nuclear Materials |
108-109 |
67-68 |
|
|
|
Brenner, S. S.; Miller, M. K. |
Atomic scale analysis with the atom probe |
1983 |
J. Met. |
35(3), |
|
|
|
|
Gorman, B.P.; Guthrey, H.; Norman, A.G.; Al-Jassim, M.; Lawrence, D.; Prosa, T. |
Atomic Scale Characterization of Compound Semiconductors using Atom Probe Tomography: Preprint |
2011 |
37th IEEE Photovoltaic Specialists Conference (PVSC 37) |
|
|
|
|
|
Rendulic, K. D.; Müller, E. W. |
Atomic structure of platinum crystals electrolytically overgrown on field ion microscope tips |
1967 |
Journal of Applied Physics |
38 |
|
|
|
|
Tsong, T. T.; Ren, D. M.; Ahmad, M. |
Atomic-layer by atomic-layer compositional depth profiling: surface segregation and impurity cosegregation of Pt-Rh and Pt-Ru alloys |
1988 |
Physical Review |
B38 |
|
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