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Author Title Year Publication Volume Pages
Juraszek, J.; Grenier, A.; Teillet, J.; Cadel, E.; Tiercelin, N.; Monnet, I.; Toulemonde, M. Atom probe tomography of swift ion irradiated multilayers 2009 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 267 912-916
Grenier, A.; Larde, R.; Cadel, E.; Le Breton, J.M.; Juraszek, J.; Vurpillot, F.; Tiercelin, N.; Pernod, P.; Teillet, J. Structural investigation of TbCo2/Fe magnetostrictive thin films by tomographic atom probe and Mossbauer spectrometry 2007 Journal of Magnetism and Magnetic Materials 310 2215-2216
Brenner, S. Sidney FIM/Atom Probe Study of Grain Boundaries in Ni3Al
Gorman, B.P.; Guthrey, H.; Norman, A.G.; Al-Jassim, M.; Lawrence, D.; Prosa, T. Atomic Scale Characterization of Compound Semiconductors using Atom Probe Tomography: Preprint 2011 37th IEEE Photovoltaic Specialists Conference (PVSC 37)
Lauhon, Lincoln J.; Adusumilli, Praneet; Ronsheim, Paul; Flaitz, Philip L.; Lawrence, Dan Atom-Probe Tomography of Semiconductor Materials and Device Structures 2009 MRS Bulletin 34 738-743
Sha, Gang; Ringer, Simon P.; Duan, Zhi Chao; Langdon, Terence G. An atom probe characterisation of grain boundaries in an aluminium alloy processed by equal-channel angular pressing 2009 International Journal of Materials Research 2009 1674-1678
Clifton, P. H.; Larson, D. J.; Gordon, L. M.; Joester, D.; Inoue, K.; Reinhard, D. A.; Prosa, T. J.; Ulfig, R. M.; Lawrence, D.; Kelly, T. F. Advances in Atom Probe Tomography Applications 2012 The 15th European Microscopy Congress
Brenner, S. S.; Miller, M. K.; Soffa, W. A. An atom probe study of precipitation in iron-chromium alloys at low temperatures 1982 Proceedings of an International Conference on Solid - Solid Phase Transformations: Proceedings of the International Conference on Solid-To-Solid Phase Transformations in Inorganic Materials Ptm9
Warren, P. J.; Cerezo, A.; Smith, W., G D Towards 3D lattice reconstruction with the position sensitive atom probe 1998 Proceedings: Microscopy and Microanalysis 4 86-87
Hren, John J. Field-ion microscopy 1968 244